M. Rafik
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Silicon Carbide Semiconductor Technologies
- Advanced Memory and Neural Computing
- Low-power high-performance VLSI design
Papers in
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- Semiconductor materials and devices 52
- Advancements in Semiconductor Devices and Circuit Design 44
- Integrated Circuits and Semiconductor Failure Analysis 32
- Ferroelectric and Negative Capacitance Devices 5
- Silicon Carbide Semiconductor Technologies 4
- Electrostatic Discharge in Electronics 3
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- Copper Interconnects and Reliability 4
- Co-authors
- D. Roy (24 shared papers)X. Federspiel (25 shared papers)G. Ribes (11 shared papers)X. Garros (16 shared papers)V. Huard (13 shared papers)F. Cacho (10 shared papers)A. Bravaix (10 shared papers)G. Ghibaudo (11 shared papers)
- Journals
- Microelectronics Reliability (5 papers)Microelectronic Engineering (4 papers)IEEE Transactions on Device and Materials Reliability (3 papers)IEEE Electron Device Letters (2 papers)ECS Transactions (1 paper)
- Partner nations
- FranceSwitzerlandUnited States
In The Last Decade
M. Rafik
50 papers receiving 342 citations
Peers
Comparison fields: 5 of 19
- Electrical and Electronic Engineering 349
- Hardware and Architecture 16
- Electronic, Optical and Magnetic Materials 21
- Instrumentation 3
- Atomic and Molecular Physics, and Optics 16
Countries citing papers authored by M. Rafik
This map shows the geographic impact of M. Rafik's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Rafik with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Rafik more than expected).
Fields of papers citing papers by M. Rafik
This network shows the impact of papers produced by M. Rafik. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Rafik. The network helps show where M. Rafik may publish in the future.
Co-authors
The 25 scholars most cited alongside M. Rafik, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 52 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2013 | 27 | |
| 2 | 2012 | 24 | |
| 3 | 2010 | 21 | |
| 4 | 2018 | 17 | |
| 5 | 2007 | 16 | |
| 6 | 2007 | 15 | |
| 7 | 2012 | 15 | |
| 8 | 2012 | 14 | |
| 9 | 2009 | 13 | |
| 10 | 2016 | 12 | |
| 11 | 2019 | 12 | |
| 12 | 2013 | 11 | |
| 13 | 2010 | 11 | |
| 14 | 2007 | 10 | |
| 15 | 2018 | 9 | |
| 16 | 2011 | 8 | |
| 17 | 2009 | 8 | |
| 18 | 2009 | 8 | |
| 19 | 2008 | 7 | |
| 20 | 2010 | 7 |
About M. Rafik
M. Rafik is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Mechanics of Materials, Hardware and Architecture and Materials Chemistry, having authored 52 papers that have together received 352 indexed citations. Recurring topics across this work include Semiconductor materials and devices (52 papers), Advancements in Semiconductor Devices and Circuit Design (44 papers), Integrated Circuits and Semiconductor Failure Analysis (32 papers), Ferroelectric and Negative Capacitance Devices (5 papers), Silicon Carbide Semiconductor Technologies (4 papers), Copper Interconnects and Reliability (4 papers), Electrostatic Discharge in Electronics (3 papers) and Metal and Thin Film Mechanics (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (349 citations), Hardware and Architecture (16 citations), Electronic, Optical and Magnetic Materials (21 citations), Instrumentation (3 citations) and Atomic and Molecular Physics, and Optics (16 citations). M. Rafik has collaborated with scholars based in France, Switzerland and United States. Frequent co-authors include D. Roy, X. Federspiel, G. Ribes, X. Garros, V. Huard, F. Cacho, A. Bravaix, G. Ghibaudo, G. Reimbold and F. Boulanger. Their work appears in journals such as Microelectronics Reliability, Microelectronic Engineering, IEEE Transactions on Device and Materials Reliability, IEEE Electron Device Letters and ECS Transactions.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.