F. Perrier
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Silicon Carbide Semiconductor Technologies
- Advanced Memory and Neural Computing
- Radiation Effects in Electronics
Papers in
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- Semiconductor materials and devices 11
- Advancements in Semiconductor Devices and Circuit Design 10
- Integrated Circuits and Semiconductor Failure Analysis 9
- Ferroelectric and Negative Capacitance Devices 2
- Electrostatic Discharge in Electronics 1
- Co-authors
- A. Bravaix (11 shared papers)M. Denais (11 shared papers)V. Huard (11 shared papers)C. Parthasarathy (9 shared papers)N. Revil (7 shared papers)G. Ribes (8 shared papers)Emmanuel Vincent (3 shared papers)C. Guérin (3 shared papers)
In The Last Decade
F. Perrier
11 papers receiving 293 citations
Peers
Comparison fields: 5 of 16
- Electrical and Electronic Engineering 302
- Hardware and Architecture 15
- Materials Chemistry 22
- Atomic and Molecular Physics, and Optics 14
- Software 1
Countries citing papers authored by F. Perrier
This map shows the geographic impact of F. Perrier's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Perrier with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Perrier more than expected).
Fields of papers citing papers by F. Perrier
This network shows the impact of papers produced by F. Perrier. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Perrier. The network helps show where F. Perrier may publish in the future.
Co-authors
The 15 scholars most cited alongside F. Perrier, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 101 | |
| 2 | 2004 | 93 | |
| 3 | 2006 | 22 | |
| 4 | 2006 | 21 | |
| 5 | 2005 | 15 | |
| 6 | 2006 | 11 | |
| 7 | 2004 | 10 | |
| 8 | 2004 | 9 | |
| 9 | 2005 | 9 | |
| 10 | 2005 | 7 | |
| 11 | 2005 | 6 |
About F. Perrier
F. Perrier is a scholar working on Electrical and Electronic Engineering, Infectious Diseases, Organic Chemistry, Surgery and Communication, having authored 11 papers that have together received 304 indexed citations. Recurring topics across this work include Semiconductor materials and devices (11 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers), Ferroelectric and Negative Capacitance Devices (2 papers) and Electrostatic Discharge in Electronics (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (302 citations), Hardware and Architecture (15 citations), Materials Chemistry (22 citations), Atomic and Molecular Physics, and Optics (14 citations) and Software (1 citation). F. Perrier has collaborated with scholars based in France, India and Finland. Frequent co-authors include A. Bravaix, M. Denais, V. Huard, C. Parthasarathy, N. Revil, G. Ribes, Emmanuel Vincent, C. Guérin, D. Roy and P.A. Stolk. Their work appears in journals such as Microelectronics Reliability and IEEE Transactions on Device and Materials Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.