Trace Hurd

506 citations
16 papers · 274 · h-index 7

Impact in

Papers in

    • Semiconductor materials and devices 11
    • Silicon and Solar Cell Technologies 4
    • Integrated Circuits and Semiconductor Failure Analysis 3
    • Electrodeposition and Electroless Coatings 2
    • Nanowire Synthesis and Applications 2
    • Advanced Surface Polishing Techniques 2

Trace Hurd

15 papers receiving 261 citations

Peers

Trace Hurd
Comparison fields: 5 of 28
  • Electronic, Optical and Magnetic Materials 118
  • Electrical and Electronic Engineering 231
  • Structural Biology 3
  • Atomic and Molecular Physics, and Optics 57
  • Surfaces, Coatings and Films 11
Replace Yong Kong Siew with:
Yong Kong Siew Belgium
Efrain Altamirano Sánchez Belgium
Tomo Ueno Japan
D. Louis France
D. Jawarani United States
Gayle Murdoch Belgium
Mohamed Boutchich France
T. Conard Belgium
Soon‐Cheon Seo United States
L.J. Tang Singapore
Trace Hurd relative to Yong Kong Siew Belgium Yong Kong Siew's profile →
Citations per field
00.5×1.5×
Yong Kong Siew · 1×
Citations per year

Countries citing papers authored by Trace Hurd

Since Specialization
Citations

This map shows the geographic impact of Trace Hurd's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Trace Hurd with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Trace Hurd more than expected).

Fields of papers citing papers by Trace Hurd

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Trace Hurd. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Trace Hurd. The network helps show where Trace Hurd may publish in the future.

Co-authors

The 25 scholars most cited alongside Trace Hurd, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Trace Hurd Line = papers co-authored together Trace Hurd links everyone, so they are left out of the graph.

All Works

16 of 16 papers shown
#Work
1 2004142
2 199639
3 199525
4 200519
5 200211
6 200210
7 20028
8 19985
9 20104
10 20033
11 20222
12 20072
13 20192
14 19941
15 19951
16 20190

About Trace Hurd

Trace Hurd is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry and Atomic and Molecular Physics, and Optics, having authored 16 papers that have together received 274 indexed citations. Recurring topics across this work include Semiconductor materials and devices (11 papers), Silicon and Solar Cell Technologies (4 papers), Copper Interconnects and Reliability (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Nanowire Synthesis and Applications (2 papers), Anodic Oxide Films and Nanostructures (2 papers), Advanced Surface Polishing Techniques (2 papers) and Electrodeposition and Electroless Coatings (2 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (118 citations), Electrical and Electronic Engineering (231 citations), Structural Biology (3 citations), Atomic and Molecular Physics, and Optics (57 citations) and Surfaces, Coatings and Films (11 citations). Trace Hurd has collaborated with scholars based in United States, Belgium and Germany. Frequent co-authors include Oliver Chyan, Tiruchirapalli Arunagiri, Robert M. Wallace, Antonio Rotondaro, Eddy Simoen, Cor Claeys, G. Brown, M. M. Heyns, Jan Vanhellemont and Moon J. Kim. Their work appears in journals such as Journal of The Electrochemical Society, Japanese Journal of Applied Physics, Electrochemical and Solid-State Letters, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms and ECS Transactions.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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