Tom Wallow
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
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- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
Papers in
-
- Advancements in Photolithography Techniques 32
- Integrated Circuits and Semiconductor Failure Analysis 21
- Silicon and Solar Cell Technologies 2
-
- Electron and X-Ray Spectroscopy Techniques 19
- Optical Coatings and Gratings 2
- Co-authors
- Bruno La Fontaine (11 shared papers)Patrick Naulleau (10 shared papers)Yunfei Deng (6 shared papers)Harry Levinson (4 shared papers)Christopher N. Anderson (6 shared papers)Obert R. Wood (8 shared papers)Ryoung-Han Kim (3 shared papers)Mark D. Smith (2 shared papers)
- Journals
- Microelectronic Engineering (2 papers)Journal of Photopolymer Science and Technology (2 papers)Journal of Micro/Nanolithography MEMS and MOEMS (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (4 papers)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (21 papers)
- Partner nations
- United StatesSouth KoreaBelgium
In The Last Decade
Tom Wallow
33 papers receiving 258 citations
Peers
Comparison fields: 5 of 28
- Surfaces, Coatings and Films 132
- Electrical and Electronic Engineering 259
- Biomedical Engineering 93
- Radiation 18
- Industrial and Manufacturing Engineering 15
Countries citing papers authored by Tom Wallow
This map shows the geographic impact of Tom Wallow's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Tom Wallow with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Tom Wallow more than expected).
Fields of papers citing papers by Tom Wallow
This network shows the impact of papers produced by Tom Wallow. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Tom Wallow. The network helps show where Tom Wallow may publish in the future.
Co-authors
The 25 scholars most cited alongside Tom Wallow, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 33 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2009 | 40 | |
| 2 | 2009 | 26 | |
| 3 | 2012 | 25 | |
| 4 | 2010 | 24 | |
| 5 | 2006 | 22 | |
| 6 | 2009 | 13 | |
| 7 | 1997 | 11 | |
| 8 | 2008 | 11 | |
| 9 | 2006 | 10 | |
| 10 | 1999 | 10 | |
| 11 | 2014 | 9 | |
| 12 | 2007 | 9 | |
| 13 | 2004 | 8 | |
| 14 | 2007 | 8 | |
| 15 | 2007 | 8 | |
| 16 | 2011 | 8 | |
| 17 | 2009 | 6 | |
| 18 | 2007 | 5 | |
| 19 | 2009 | 5 | |
| 20 | 2007 | 5 |
About Tom Wallow
Tom Wallow is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering, Hardware and Architecture and Mechanical Engineering, having authored 33 papers that have together received 292 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (32 papers), Integrated Circuits and Semiconductor Failure Analysis (21 papers), Electron and X-Ray Spectroscopy Techniques (19 papers), Nanofabrication and Lithography Techniques (3 papers), Silicon and Solar Cell Technologies (2 papers), VLSI and Analog Circuit Testing (2 papers), Optical Coatings and Gratings (2 papers) and Industrial Vision Systems and Defect Detection (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (132 citations), Electrical and Electronic Engineering (259 citations), Biomedical Engineering (93 citations), Radiation (18 citations) and Industrial and Manufacturing Engineering (15 citations). Tom Wallow has collaborated with scholars based in United States, South Korea and Belgium. Frequent co-authors include Bruno La Fontaine, Patrick Naulleau, Yunfei Deng, Harry Levinson, Christopher N. Anderson, Obert R. Wood, Ryoung-Han Kim, Mark D. Smith, Adam R. Pawloski and Kenneth A. Goldberg. Their work appears in journals such as Microelectronic Engineering, Journal of Photopolymer Science and Technology, Journal of Micro/Nanolithography MEMS and MOEMS, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.