Patrick Naulleau

295 papers and 3.0k indexed citations i.

About

Patrick Naulleau is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Radiation. According to data from OpenAlex, Patrick Naulleau has authored 295 papers receiving a total of 3.0k indexed citations (citations by other indexed papers that have themselves been cited), including 254 papers in Electrical and Electronic Engineering, 164 papers in Surfaces, Coatings and Films and 97 papers in Radiation. Recurrent topics in Patrick Naulleau’s work include Advancements in Photolithography Techniques (238 papers), Electron and X-Ray Spectroscopy Techniques (133 papers) and Integrated Circuits and Semiconductor Failure Analysis (115 papers). Patrick Naulleau is often cited by papers focused on Advancements in Photolithography Techniques (238 papers), Electron and X-Ray Spectroscopy Techniques (133 papers) and Integrated Circuits and Semiconductor Failure Analysis (115 papers). Patrick Naulleau collaborates with scholars based in United States, South Korea and Germany. Patrick Naulleau's co-authors include Kenneth A. Goldberg, Jeffrey Bokor, Gregg M. Gallatin, Senajith Rekawa, Eric M. Gullikson, Christopher N. Anderson, Weilun Chao, Paul Denham, David Attwood and Jason P. Cain and has published in prestigious journals such as Advanced Materials, The Journal of Chemical Physics and Applied Physics Letters.

In The Last Decade

Co-authorship network of co-authors of Patrick Naulleau i

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Fields of papers citing papers by Patrick Naulleau

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Patrick Naulleau. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick Naulleau. The network helps show where Patrick Naulleau may publish in the future.

Countries citing papers authored by Patrick Naulleau

Since Specialization

Citations

This map shows the geographic impact of Patrick Naulleau's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick Naulleau with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick Naulleau more than expected).

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar’s output or impact.

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