L. Pain

432 citations
31 papers · 179 · h-index 8

Impact in

Papers in

L. Pain

30 papers receiving 162 citations

Peers

L. Pain
Comparison fields: 5 of 32
  • Surfaces, Coatings and Films 56
  • Electrical and Electronic Engineering 144
  • Biomedical Engineering 74
  • Structural Biology 2
  • Materials Chemistry 34
Replace Yin-Jung Chang with:
Yin-Jung Chang Taiwan
P. Gouraud France
S. Baudot France
F.N. Cubaynes Belgium
E. Ferry United States
Jiro Ryuta Japan
T. Grabolla Germany
F. Leverd France
Cesar Bartolo-Perez United States
S. Kawazu Japan
L. Pain relative to Yin-Jung Chang Taiwan Yin-Jung Chang's profile →
Citations per field
00.5×1.5×
Yin-Jung Chang · 1×
Citations per year

Countries citing papers authored by L. Pain

Since Specialization
Citations

This map shows the geographic impact of L. Pain's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L. Pain with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L. Pain more than expected).

Fields of papers citing papers by L. Pain

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by L. Pain. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L. Pain. The network helps show where L. Pain may publish in the future.

Co-authors

The 25 scholars most cited alongside L. Pain, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with L. Pain Line = papers co-authored together L. Pain links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 31 papers — load more, or switch the sort, to bring in the rest.

#Work
1 201223
2 201016
3 200914
4 200014
5 20118
6 20058
7 20067
8 19967
9 20096
10
Line width roughness reduction strategies for patterns exposed via electron beam lithography
20146
11 20136
12 20126
13 20095
14
MEASUREMENT OF (n,2n) AND (n,3n) CROSS SECTIONS AT 14-MeV INCIDENT ENERGY.
19695
15 20105
16 20085
17 20104
18 20144
19 20134
20 20094

About L. Pain

L. Pain is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering, Hardware and Architecture and Electronic, Optical and Magnetic Materials, having authored 31 papers that have together received 179 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (28 papers), Electron and X-Ray Spectroscopy Techniques (14 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Advanced Surface Polishing Techniques (10 papers), Nanofabrication and Lithography Techniques (8 papers), VLSI and Analog Circuit Testing (3 papers), Semiconductor materials and devices (3 papers) and Silicon and Solar Cell Technologies (1 paper). The work is most often cited by research in Surfaces, Coatings and Films (56 citations), Electrical and Electronic Engineering (144 citations), Biomedical Engineering (74 citations), Structural Biology (2 citations) and Materials Chemistry (34 citations). L. Pain has collaborated with scholars based in France, Switzerland and Japan. Frequent co-authors include David del Rio, Guillaume Fleury, S. Tedesco, Cristina Ribeiro, C. Rosilio, Raluca Tiron, T. Chevolleau, Hervé Fontaine, Daniel Henry and Robert J. Miller. Their work appears in journals such as Microelectronic Engineering, Japanese Journal of Applied Physics, Journal of Materials Science, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact