Gijsbert Rispens
Impact in
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- Advancements in Photolithography Techniques
- Semiconductor materials and devices
- Plasma Diagnostics and Applications
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- Advanced X-ray Imaging Techniques
Papers in
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- Advancements in Photolithography Techniques 43
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- Industrial Vision Systems and Defect Detection 1
- Co-authors
- Yasin Ekinci (13 shared papers)Sander F. Wuister (3 shared papers)Eelco van Setten (6 shared papers)Elizabeth Buitrago (7 shared papers)Michaela Vockenhuber (8 shared papers)Jan van Schoot (4 shared papers)Jo Finders (5 shared papers)Jens Timo Neumann (2 shared papers)
- Journals
- Journal of Photopolymer Science and Technology (1 paper)Fraunhofer-Publica (Fraunhofer-Gesellschaft) (1 paper)International Conference on Extreme Ultraviolet Lithography (9 papers)DORA PSI (Paul Scherrer Institute) (4 papers)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (10 papers)
- Partner nations
- NetherlandsBelgiumSwitzerland
In The Last Decade
Gijsbert Rispens
41 papers receiving 398 citations
Peers
Comparison fields: 5 of 17
- Electrical and Electronic Engineering 426
- Radiation 4
- Industrial and Manufacturing Engineering 3
- Polymers and Plastics 2
- Biomedical Engineering 6
Countries citing papers authored by Gijsbert Rispens
This map shows the geographic impact of Gijsbert Rispens's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Gijsbert Rispens with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Gijsbert Rispens more than expected).
Fields of papers citing papers by Gijsbert Rispens
This network shows the impact of papers produced by Gijsbert Rispens. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Gijsbert Rispens. The network helps show where Gijsbert Rispens may publish in the future.
Co-authors
The 25 scholars most cited alongside Gijsbert Rispens, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 43 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2017 | 56 | |
| 2 | 2017 | 47 | |
| 3 | 2016 | 30 | |
| 4 | 2018 | 22 | |
| 5 | 2017 | 21 | |
| 6 | 2016 | 18 | |
| 7 | 2016 | 16 | |
| 8 | 2019 | 16 | |
| 9 | 2015 | 15 | |
| 10 | 2017 | 15 | |
| 11 | 2018 | 15 | |
| 12 | 2016 | 14 | |
| 13 | 2016 | 14 | |
| 14 | 2020 | 12 | |
| 15 | 2015 | 11 | |
| 16 | 2018 | 10 | |
| 17 | 2018 | 10 | |
| 18 | 2021 | 9 | |
| 19 | 2018 | 7 | |
| 20 | 2021 | 7 |
About Gijsbert Rispens
Gijsbert Rispens is a scholar working on Electrical and Electronic Engineering, Industrial and Manufacturing Engineering, Nuclear Energy and Engineering, Waste Management and Disposal and Infectious Diseases, having authored 43 papers that have together received 436 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (43 papers) and Industrial Vision Systems and Defect Detection (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (426 citations), Radiation (4 citations), Industrial and Manufacturing Engineering (3 citations), Polymers and Plastics (2 citations) and Biomedical Engineering (6 citations). Gijsbert Rispens has collaborated with scholars based in Netherlands, Belgium and Switzerland. Frequent co-authors include Yasin Ekinci, Sander F. Wuister, Eelco van Setten, Elizabeth Buitrago, Michaela Vockenhuber, Jan van Schoot, Jo Finders, Jens Timo Neumann, Bernhard Kneer and Andreas Frommhold. Their work appears in journals such as Journal of Photopolymer Science and Technology, Fraunhofer-Publica (Fraunhofer-Gesellschaft), International Conference on Extreme Ultraviolet Lithography, DORA PSI (Paul Scherrer Institute) and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.