Gijsbert Rispens
Impact in
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques
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- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
Papers in
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- Advancements in Photolithography Techniques 39
- Integrated Circuits and Semiconductor Failure Analysis 28
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- Electron and X-Ray Spectroscopy Techniques 16
- Optical Coatings and Gratings 3
- Co-authors
- Yasin Ekinci (13 shared papers)Sander F. Wuister (3 shared papers)Eelco van Setten (6 shared papers)Elizabeth Buitrago (7 shared papers)Michaela Vockenhuber (8 shared papers)Jo Finders (5 shared papers)Jan van Schoot (4 shared papers)Bernhard Kneer (2 shared papers)
- Journals
- Journal of Micro/Nanolithography MEMS and MOEMS (3 papers)Journal of Photopolymer Science and Technology (1 paper)Journal of Micro/Nanopatterning Materials and Metrology (2 papers)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (9 papers)Fraunhofer-Publica (Fraunhofer-Gesellschaft) (1 paper)
- Partner nations
- NetherlandsBelgiumSwitzerland
In The Last Decade
Gijsbert Rispens
40 papers receiving 362 citations
Peers
Comparison fields: 5 of 29
- Surfaces, Coatings and Films 225
- Electrical and Electronic Engineering 377
- Radiation 42
- Structural Biology 6
- Industrial and Manufacturing Engineering 25
Countries citing papers authored by Gijsbert Rispens
This map shows the geographic impact of Gijsbert Rispens's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Gijsbert Rispens with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Gijsbert Rispens more than expected).
Fields of papers citing papers by Gijsbert Rispens
This network shows the impact of papers produced by Gijsbert Rispens. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Gijsbert Rispens. The network helps show where Gijsbert Rispens may publish in the future.
Co-authors
The 25 scholars most cited alongside Gijsbert Rispens, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 41 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2017 | 54 | |
| 2 | 2017 | 46 | |
| 3 | 2016 | 30 | |
| 4 | 2018 | 21 | |
| 5 | 2017 | 20 | |
| 6 | 2016 | 15 | |
| 7 | 2018 | 15 | |
| 8 | 2017 | 15 | |
| 9 | 2019 | 15 | |
| 10 | 2015 | 13 | |
| 11 | 2016 | 13 | |
| 12 | 2020 | 11 | |
| 13 | 2015 | 11 | |
| 14 | 2016 | 10 | |
| 15 | 2018 | 10 | |
| 16 | 2018 | 9 | |
| 17 | 2021 | 8 | |
| 18 | 2021 | 7 | |
| 19 | 2016 | 6 | |
| 20 | 2018 | 6 |
About Gijsbert Rispens
Gijsbert Rispens is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering, Industrial and Manufacturing Engineering and Radiation, having authored 41 papers that have together received 396 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (39 papers), Integrated Circuits and Semiconductor Failure Analysis (28 papers), Electron and X-Ray Spectroscopy Techniques (16 papers), Advanced Surface Polishing Techniques (8 papers), Advanced X-ray Imaging Techniques (4 papers), Optical Coatings and Gratings (3 papers), Industrial Vision Systems and Defect Detection (3 papers) and VLSI and Analog Circuit Testing (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (225 citations), Electrical and Electronic Engineering (377 citations), Radiation (42 citations), Structural Biology (6 citations) and Industrial and Manufacturing Engineering (25 citations). Gijsbert Rispens has collaborated with scholars based in Netherlands, Belgium and Switzerland. Frequent co-authors include Yasin Ekinci, Sander F. Wuister, Eelco van Setten, Elizabeth Buitrago, Michaela Vockenhuber, Jo Finders, Jan van Schoot, Bernhard Kneer, Jens Timo Neumann and Kars Troost. Their work appears in journals such as Journal of Micro/Nanolithography MEMS and MOEMS, Journal of Photopolymer Science and Technology, Journal of Micro/Nanopatterning Materials and Metrology, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE and Fraunhofer-Publica (Fraunhofer-Gesellschaft).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.