Geng Han
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Advancements in Photolithography Techniques 18
- Integrated Circuits and Semiconductor Failure Analysis 4
-
- Electron and X-Ray Spectroscopy Techniques 9
- Co-authors
- F. Cerrina (7 shared papers)Katerina Moloni (1 shared paper)Yuling Ma (1 shared paper)Scott Mansfield (6 shared papers)Lars W. Liebmann (4 shared papers)Sung Oh Hwang (1 shared paper)Sungho Kang (1 shared paper)Jaeseok Kim (1 shared paper)
- Journals
- Journal of Applied Crystallography (1 paper)IEEE Signal Processing Letters (1 paper)RSC Advances (1 paper)Metrika (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (6 papers)
- Partner nations
- United StatesAustraliaSouth Korea
In The Last Decade
Geng Han
23 papers receiving 265 citations
Peers
Comparison fields: 5 of 48
- Surfaces, Coatings and Films 91
- Nuclear Energy and Engineering 2
- Electrical and Electronic Engineering 228
- Hardware and Architecture 24
- Signal Processing 24
Countries citing papers authored by Geng Han
This map shows the geographic impact of Geng Han's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Geng Han with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Geng Han more than expected).
Fields of papers citing papers by Geng Han
This network shows the impact of papers produced by Geng Han. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Geng Han. The network helps show where Geng Han may publish in the future.
Co-authors
The 25 scholars most cited alongside Geng Han, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 24 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2001 | 79 | |
| 2 | 2004 | 31 | |
| 3 | 2006 | 27 | |
| 4 | 2002 | 21 | |
| 5 | 2014 | 15 | |
| 6 | 1999 | 14 | |
| 7 | 2000 | 13 | |
| 8 | 2022 | 12 | |
| 9 | 2001 | 12 | |
| 10 | 2008 | 12 | |
| 11 | 2007 | 11 | |
| 12 | 2003 | 7 | |
| 13 | 2022 | 6 | |
| 14 | 2006 | 5 | |
| 15 | 2006 | 5 | |
| 16 | 2007 | 4 | |
| 17 | 2007 | 4 | |
| 18 | 2006 | 3 | |
| 19 | 2018 | 2 | |
| 20 | 2001 | 2 |
About Geng Han
Geng Han is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Industrial and Manufacturing Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics, having authored 24 papers that have together received 288 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (18 papers), Electron and X-Ray Spectroscopy Techniques (9 papers), Industrial Vision Systems and Defect Detection (4 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Surface and Thin Film Phenomena (3 papers), Advanced Surface Polishing Techniques (3 papers), VLSI and Analog Circuit Testing (3 papers) and Advanced X-ray Imaging Techniques (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (91 citations), Nuclear Energy and Engineering (2 citations), Electrical and Electronic Engineering (228 citations), Hardware and Architecture (24 citations) and Signal Processing (24 citations). Geng Han has collaborated with scholars based in United States, Australia and South Korea. Frequent co-authors include F. Cerrina, Katerina Moloni, Yuling Ma, Scott Mansfield, Lars W. Liebmann, Sung Oh Hwang, Sungho Kang, Jaeseok Kim, Juan R. Maldonado and R. Tsai. Their work appears in journals such as Journal of Applied Crystallography, IEEE Signal Processing Letters, RSC Advances, Metrika and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.