Mark D. Smith

642 citations
68 papers · 460 · h-index 12

Impact in

Papers in

Mark D. Smith

61 papers receiving 393 citations

Peers

Mark D. Smith
Comparison fields: 5 of 33
  • Surfaces, Coatings and Films 212
  • Electrical and Electronic Engineering 434
  • Hardware and Architecture 25
  • Biomedical Engineering 137
  • Industrial and Manufacturing Engineering 33
Replace John J. Biafore with:
John J. Biafore United States
Mireille Maenhoudt Belgium
Alessandro Vaglio Pret Belgium
Geng Han United States
Koen van Ingen Schenau Netherlands
Han-Ku Cho South Korea
Ryoung-Han Kim United States
Carlos Fonseca United States
Neal Lafferty United States
Frieda Van Roey Belgium
Mark D. Smith relative to John J. Biafore United States John J. Biafore's profile →
Citations per field
00.5×1.5×
John J. Biafore · 1×
Citations per year

Countries citing papers authored by Mark D. Smith

Since Specialization
Citations

This map shows the geographic impact of Mark D. Smith's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mark D. Smith with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mark D. Smith more than expected).

Fields of papers citing papers by Mark D. Smith

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Mark D. Smith. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mark D. Smith. The network helps show where Mark D. Smith may publish in the future.

Co-authors

The 25 scholars most cited alongside Mark D. Smith, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Mark D. Smith Line = papers co-authored together Mark D. Smith links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 68 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200940
2 200126
3 201026
4 200724
5 201321
6 200420
7 200118
8 201113
9 201113
10 201212
11 201112
12 201411
13 200210
14 201110
15 20149
16 20078
17 20028
18 20088
19 20088
20 20087

About Mark D. Smith

Mark D. Smith is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering, Atomic and Molecular Physics, and Optics and Media Technology, having authored 68 papers that have together received 460 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (61 papers), Electron and X-Ray Spectroscopy Techniques (24 papers), Integrated Circuits and Semiconductor Failure Analysis (23 papers), Optical Coatings and Gratings (8 papers), Advanced Surface Polishing Techniques (8 papers), Semiconductor materials and devices (7 papers), Nanofabrication and Lithography Techniques (6 papers) and Surface and Thin Film Phenomena (5 papers). The work is most often cited by research in Surfaces, Coatings and Films (212 citations), Electrical and Electronic Engineering (434 citations), Hardware and Architecture (25 citations), Biomedical Engineering (137 citations) and Industrial and Manufacturing Engineering (33 citations). Mark D. Smith has collaborated with scholars based in United States, Belgium and South Korea. Frequent co-authors include John J. Biafore, Chris A. Mack, Stewart A. Robertson, Chao Fang, Jeffrey D. Byers, Alessandro Vaglio Pret, James W. Thackeray, Roel Gronheid, Jeff D. Byers and John S. Petersen. Their work appears in journals such as Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Journal of Photopolymer Science and Technology, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE and ChemInform.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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