S.V. Walstra
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
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- Radiation Effects in Electronics
- Semiconductor materials and devices
- Low-power high-performance VLSI design
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Memory and Neural Computing
Papers in
-
- Semiconductor materials and devices 8
- Advancements in Semiconductor Devices and Circuit Design 4
- Radiation Effects in Electronics 4
- Integrated Circuits and Semiconductor Failure Analysis 3
- Ferroelectric and Negative Capacitance Devices 1
-
- Semiconductor materials and interfaces 2
- Co-authors
- Changhong Dai (2 shared papers)Tanay Karnik (3 shared papers)Shekhar Borkar (3 shared papers)G. Dermer (3 shared papers)B. Bloechel (3 shared papers)James Tschanz (3 shared papers)P. Hazucha (3 shared papers)J. Maiz (3 shared papers)
- Journals
- IEEE Transactions on Device and Materials Reliability (1 paper)IEEE Transactions on Electron Devices (1 paper)IEEE Journal of Solid-State Circuits (1 paper)Solid-State Electronics (1 paper)
- Partner nations
- United States
In The Last Decade
S.V. Walstra
8 papers receiving 392 citations
Peers
Comparison fields: 5 of 21
- Hardware and Architecture 185
- Electrical and Electronic Engineering 397
- Safety, Risk, Reliability and Quality 19
- Software 5
- Computer Networks and Communications 29
Countries citing papers authored by S.V. Walstra
This map shows the geographic impact of S.V. Walstra's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S.V. Walstra with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S.V. Walstra more than expected).
Fields of papers citing papers by S.V. Walstra
This network shows the impact of papers produced by S.V. Walstra. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S.V. Walstra. The network helps show where S.V. Walstra may publish in the future.
Co-authors
The 19 scholars most cited alongside S.V. Walstra, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 118 | |
| 2 | 2004 | 93 | |
| 3 | 2004 | 56 | |
| 4 | 2005 | 52 | |
| 5 | 2009 | 39 | |
| 6 | 1997 | 32 | |
| 7 | 1998 | 11 | |
| 8 | 2002 | 1 |
About S.V. Walstra
S.V. Walstra is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Hardware and Architecture, Infectious Diseases and Organic Chemistry, having authored 8 papers that have together received 402 indexed citations. Recurring topics across this work include Semiconductor materials and devices (8 papers), Advancements in Semiconductor Devices and Circuit Design (4 papers), Radiation Effects in Electronics (4 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Semiconductor materials and interfaces (2 papers), VLSI and Analog Circuit Testing (2 papers) and Ferroelectric and Negative Capacitance Devices (1 paper). The work is most often cited by research in Hardware and Architecture (185 citations), Electrical and Electronic Engineering (397 citations), Safety, Risk, Reliability and Quality (19 citations), Software (5 citations) and Computer Networks and Communications (29 citations). S.V. Walstra has collaborated with scholars based in United States. Frequent co-authors include Changhong Dai, Tanay Karnik, Shekhar Borkar, G. Dermer, B. Bloechel, James Tschanz, P. Hazucha, J. Maiz, Chih‐Tang Sah and Vivek De. Their work appears in journals such as IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Electron Devices, IEEE Journal of Solid-State Circuits and Solid-State Electronics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.