J. Fabula

421 citations
6 papers · 323 · h-index 4

Impact in

    • VLSI and Analog Circuit Testing
    • Physical Unclonable Functions (PUFs) and Hardware Security
    • Embedded Systems Design Techniques
    • Radiation Effects in Electronics
    • Low-power high-performance VLSI design
    • Semiconductor materials and devices
    • Integrated Circuits and Semiconductor Failure Analysis

Papers in

J. Fabula

6 papers receiving 302 citations

Peers

J. Fabula
Comparison fields: 5 of 24
  • Hardware and Architecture 219
  • Electrical and Electronic Engineering 305
  • Safety, Risk, Reliability and Quality 23
  • Radiation 18
  • Software 8
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Citations per field
00.5×3.6×
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Citations per year

Countries citing papers authored by J. Fabula

Since Specialization
Citations

This map shows the geographic impact of J. Fabula's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Fabula with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Fabula more than expected).

Fields of papers citing papers by J. Fabula

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Fabula. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Fabula. The network helps show where J. Fabula may publish in the future.

Co-authors

The 16 scholars most cited alongside J. Fabula, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. Fabula Line = papers co-authored together J. Fabula links everyone, so they are left out of the graph.

All Works

6 of 6 papers shown

About J. Fabula

J. Fabula is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Atomic and Molecular Physics, and Optics, Radiation and Materials Chemistry, having authored 6 papers that have together received 323 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (4 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), VLSI and Analog Circuit Testing (2 papers), Low-power high-performance VLSI design (1 paper), VLSI and FPGA Design Techniques (1 paper), Force Microscopy Techniques and Applications (1 paper), Diamond and Carbon-based Materials Research (1 paper) and Embedded Systems Design Techniques (1 paper). The work is most often cited by research in Hardware and Architecture (219 citations), Electrical and Electronic Engineering (305 citations), Safety, Risk, Reliability and Quality (23 citations), Radiation (18 citations) and Software (8 citations). J. Fabula has collaborated with scholars based in United States and Brazil. Frequent co-authors include C. Carmichael, Austin Lesea, Peter Alfke, Saar Drimer, F. Lima, R. Padovani, Ricardo Reis, Robert A. Weller, P.E. Dodd and Robert A. Reed. Their work appears in journals such as IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Nuclear Science and NASA Technical Reports Server (NASA).

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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