Jun Furuta

749 citations

77 papers · 558 · h-index 12

Impact in

Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
Electrical and Electronic Engineering top 10%
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- Advanced Memory and Neural Computing

Papers in

Electrical and Electronic Engineering 76
- Radiation Effects in Electronics 52
- Semiconductor materials and devices 50
- Advancements in Semiconductor Devices and Circuit Design 35
- Low-power high-performance VLSI design 17
- Silicon Carbide Semiconductor Technologies 12
- Integrated Circuits and Semiconductor Failure Analysis 9
Hardware and Architecture 18
- VLSI and Analog Circuit Testing 18

Co-authors: Kazutoshi Kobayashi (69 shared papers)Hidetoshi Onodera (18 shared papers)Kodai Yamada (10 shared papers)Keisuke Kubota (1 shared paper)Fei Mo (1 shared paper)Yukinobu Watanabe (1 shared paper)Shinichiro Abe (1 shared paper)Masanori Hashimoto (1 shared paper)
Journals: IEEE Transactions on Nuclear Science (11 papers)IEICE Transactions on Electronics (9 papers)Japanese Journal of Applied Physics (2 papers)IEEE Transactions on Semiconductor Manufacturing (1 paper)IEEE Open Journal of Power Electronics (1 paper)
Partner nations: Japan Belgium United States

In The Last Decade

Jun Furuta

70 papers receiving 550 citations

Peers

Countries citing papers authored by Jun Furuta

Since Specialization

Citations

This map shows the geographic impact of Jun Furuta's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jun Furuta with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jun Furuta more than expected).

Fields of papers citing papers by Jun Furuta

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jun Furuta. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jun Furuta. The network helps show where Jun Furuta may publish in the future.

Co-authors

The 25 scholars most cited alongside Jun Furuta, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Jun Furuta Line = papers co-authored together Jun Furuta links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 77 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	A Low-Power and Area-Efficient Radiation-Hard Redundant Flip-Flop, DICE ACFF, in a 65 nm Thin-BOX FD-SOI IEEE Transactions on Nuclear Science ·Kazutoshi Kobayashi, Keisuke Kubota, Masaki Masuda, Yuuki Manzawa, Jun Furuta, S. Kanda, Hidetoshi Onodera	2014	57
2	An Area-Efficient 65 nm Radiation-Hard Dual-Modular Flip-Flop to Avoid Multiple Cell Upsets IEEE Transactions on Nuclear Science ·Ryosuke Yamamoto, Chikara Hamanaka, Jun Furuta, Kazutoshi Kobayashi, Hidetoshi Onodera	2011	49
3	A 65nm Bistable Cross-coupled Dual Modular Redundancy Flip-Flop capable of protecting soft errors on the C-element Jun Furuta, Chikara Ham, Kazutoshi Kobayashi, Hidetoshi Onodera	2010	33
4	Process Dependence of Soft Errors Induced by Alpha Particles, Heavy Ions, and High Energy Neutrons on Flip Flops in FDSOI IEEE Journal of the Electron Devices Society ·Mitsunori Ebara, Kodai Yamada, Kentaro Kojima, Jun Furuta, Kazutoshi Kobayashi	2019	30
5	Impact of cell distance and well-contact density on neutron-induced Multiple Cell Upsets Jun Furuta, Kazutoshi Kobayashi, Hidetoshi Onodera	2013	30
6	Radiation-Hardened Flip-Flops With Low-Delay Overhead Using pMOS Pass-Transistors to Suppress SET Pulses in a 65-nm FDSOI Process IEEE Transactions on Nuclear Science ·Kodai Yamada, Haruki Maruoka, Jun Furuta, Kazutoshi Kobayashi	2018	26
7	Measurement of neutron-induced SET pulse width using propagation-induced pulse shrinking Jun Furuta, Chikara Hamanaka, Kazutoshi Kobayashi, Hidetoshi Onodera	2011	17
8	Design of RCD snubber considering wiring inductance for MHz-switching of SiC-MOSFET Yuki Yamashita, Jun Furuta, Sho Inamori, Kazutoshi Kobayashi	2017	16
9	Sensitivity to soft errors of NMOS and PMOS transistors evaluated by latches with stacking structures in a 65 nm FDSOI process Kodai Yamada, Haruki Maruoka, Jun Furuta, Kazutoshi Kobayashi	2018	15
10	Characterizing SRAM and FF soft error rates with measurement and simulation Integration ·Masanori Hashimoto, Kazutoshi Kobayashi, Jun Furuta, Shinichiro Abe, Yukinobu Watanabe	2019	15
11	A low surge voltage and fast speed gate driver for SiC MOSFET with switched capacitor circuit Fei Mo, Jun Furuta, Kazutoshi Kobayashi	2016	12
12	A 65 nm Low-Power Adaptive-Coupling Redundant Flip-Flop IEEE Transactions on Nuclear Science ·Masaki Masuda, Kubota Kanto, Ryosuke Yamamoto, Jun Furuta, Kazutoshi Kobayashi, Hidetoshi Onodera	2013	11
13	A Low-Power Radiation-Hardened Flip-Flop with Stacked Transistors in a 65 nm FDSOI Process IEICE Transactions on Electronics ·Haruki Maruoka, Masashi Hifumi, Jun Furuta, Kazutoshi Kobayashi	2018	11
14	Intrinsic Vulnerability to Soft Errors and a Mitigation Technique by Layout Optimization on DICE Flip Flops in a 65-nm Bulk Process IEEE Transactions on Nuclear Science ·Fuma Mori, Mitsunori Ebara, Yuto Tsukita, Jun Furuta, Kazutoshi Kobayashi	2021	11
15	Dependence of Cell Distance and Well-Contact Density on MCU Rates by Device Simulations and Neutron Experiments in a 65-nm Bulk Process IEEE Transactions on Nuclear Science ·Kuiyuan Zhangd, Jun Furuta, Kazutoshi Kobayashi, Hidetoshi Onodera	2014	10
16	Evaluation of Soft-Error Tolerance by Neutrons and Heavy Ions on Flip Flops With Guard Gates in a 65-nm Thin BOX FDSOI Process IEEE Transactions on Nuclear Science ·Mitsunori Ebara, Kodai Yamada, Kentaro Kojima, Yuto Tsukita, Jun Furuta, Kazutoshi Kobayashi	2020	9
17	A Radiation-Hardened Non-Redundant Flip-Flop, Stacked Leveling Critical Charge Flip-Flop in a 65 nm Thin BOX FD-SOI Process IEEE Transactions on Nuclear Science ·Jun Furuta, Junki Yamaguchi, Kazutoshi Kobayashi	2016	9
18	Analysis of Soft Error Rates in 65- and 28-nm FD-SOI Processes Depending on BOX Region Thickness and Body Bias by Monte-Carlo Based Simulations IEEE Transactions on Nuclear Science ·Kuiyuan Zhang, Shigehiro Umehara, Junki Yamaguchi, Jun Furuta, Kazutoshi Kobayashi	2016	9
19	A Radiation-Hardened Non-Redundant Flip-Flop, Stacked Leveling Critical Charge Flip-Flop in a 65 nm Thin BOX FD-SOI Process Junki Yamaguchi, Jun Furuta, Kazutoshi Kobayashi	2015	9
20	Extracting Voltage Dependence of BTI-induced Degradation Without Temporal Factors by Using BTI-Sensitive and BTI-Insensitive Ring Oscillators IEEE Transactions on Semiconductor Manufacturing ·Ryo Kishida, Takuya Asuke, Jun Furuta, Kazutoshi Kobayashi	2020	8

About Jun Furuta

Jun Furuta is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Condensed Matter Physics, Radiation and Safety, Risk, Reliability and Quality, having authored 77 papers that have together received 558 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (52 papers), Semiconductor materials and devices (50 papers), Advancements in Semiconductor Devices and Circuit Design (35 papers), VLSI and Analog Circuit Testing (18 papers), Low-power high-performance VLSI design (17 papers), Silicon Carbide Semiconductor Technologies (12 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and GaN-based semiconductor devices and materials (7 papers). The work is most often cited by research in Hardware and Architecture (203 citations), Electrical and Electronic Engineering (546 citations), Condensed Matter Physics (32 citations), Safety, Risk, Reliability and Quality (8 citations) and Automotive Engineering (10 citations). Jun Furuta has collaborated with scholars based in Japan, Belgium and United States. Frequent co-authors include Kazutoshi Kobayashi, Hidetoshi Onodera, Kodai Yamada, Keisuke Kubota, Fei Mo, Yukinobu Watanabe, Shinichiro Abe, Masanori Hashimoto, Stefaan Decoutere and Takehiro Takahashi. Their work appears in journals such as IEEE Transactions on Nuclear Science, IEICE Transactions on Electronics, Japanese Journal of Applied Physics, IEEE Transactions on Semiconductor Manufacturing and IEEE Open Journal of Power Electronics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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Jun Furuta

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