Jonathan R. Ahlbin
About
Jonathan R. Ahlbin has authored 30 papers that have received a total of 930 indexed citations.
This includes 30 papers in Electrical and Electronic Engineering, 16 papers in Hardware and Architecture and 1 paper in Materials Chemistry. The topics of these papers are Radiation Effects in Electronics (27 papers), VLSI and Analog Circuit Testing (16 papers) and Semiconductor materials and devices (16 papers). Jonathan R. Ahlbin is often cited by papers focused on Radiation Effects in Electronics (27 papers), VLSI and Analog Circuit Testing (16 papers) and Semiconductor materials and devices (16 papers) and collaborates with scholars based in United States, Israel and Canada. Jonathan R. Ahlbin's co-authors include L. W. Massengill, B. L. Bhuva, Matthew J. Gadlage, Ronald D. Schrimpf and Robert A. Reed and has published in prestigious journals such as Solid-State Electronics, IEEE Transactions on Nuclear Science and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
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