S. E. Diehl
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
-
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
- Advanced Memory and Neural Computing
- Electrostatic Discharge in Electronics
Papers in
-
- Radiation Effects in Electronics 12
- Semiconductor materials and devices 8
- Integrated Circuits and Semiconductor Failure Analysis 5
- Advancements in Semiconductor Devices and Circuit Design 4
- Low-power high-performance VLSI design 3
- Silicon Carbide Semiconductor Technologies 2
- Electrostatic Discharge in Electronics 2
-
- VLSI and Analog Circuit Testing 5
- Co-authors
- J.B. Langworthy (1 shared paper)E.L. Petersen (1 shared paper)W. A. Kolasinski (4 shared papers)R. Koga (3 shared papers)A. Ochoa (2 shared papers)B.D. Shafer (2 shared papers)L. W. Massengill (3 shared papers)P. V. Dressendorfer (1 shared paper)
- Journals
- IEEE Transactions on Nuclear Science (13 papers)IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (1 paper)
- Partner nations
- United States
In The Last Decade
S. E. Diehl
15 papers receiving 400 citations
Peers
Comparison fields: 5 of 24
- Hardware and Architecture 134
- Electrical and Electronic Engineering 434
- Safety, Risk, Reliability and Quality 22
- Radiation 18
- Nuclear and High Energy Physics 18
Countries citing papers authored by S. E. Diehl
This map shows the geographic impact of S. E. Diehl's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. E. Diehl with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. E. Diehl more than expected).
Fields of papers citing papers by S. E. Diehl
This network shows the impact of papers produced by S. E. Diehl. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. E. Diehl. The network helps show where S. E. Diehl may publish in the future.
Co-authors
The 22 scholars most cited alongside S. E. Diehl, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1983 | 113 | |
| 2 | 1982 | 71 | |
| 3 | 1982 | 56 | |
| 4 | 1983 | 37 | |
| 5 | 1983 | 28 | |
| 6 | 1986 | 26 | |
| 7 | 1981 | 17 | |
| 8 | 1983 | 17 | |
| 9 | 1986 | 16 | |
| 10 | 1986 | 15 | |
| 11 | 1986 | 13 | |
| 12 | 1983 | 12 | |
| 13 | 1986 | 12 | |
| 14 | 1986 | 5 | |
| 15 | 1982 | 4 |
About S. E. Diehl
S. E. Diehl is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Safety, Risk, Reliability and Quality, Nuclear and High Energy Physics and Infectious Diseases, having authored 15 papers that have together received 442 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (12 papers), Semiconductor materials and devices (8 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), VLSI and Analog Circuit Testing (5 papers), Advancements in Semiconductor Devices and Circuit Design (4 papers), Low-power high-performance VLSI design (3 papers), Silicon Carbide Semiconductor Technologies (2 papers) and Electrostatic Discharge in Electronics (2 papers). The work is most often cited by research in Hardware and Architecture (134 citations), Electrical and Electronic Engineering (434 citations), Safety, Risk, Reliability and Quality (22 citations), Radiation (18 citations) and Nuclear and High Energy Physics (18 citations). S. E. Diehl has collaborated with scholars based in United States. Frequent co-authors include J.B. Langworthy, E.L. Petersen, W. A. Kolasinski, R. Koga, A. Ochoa, B.D. Shafer, L. W. Massengill, P. V. Dressendorfer, R.C. Jaeger and John Schroeder. Their work appears in journals such as IEEE Transactions on Nuclear Science and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.