P. Charvát
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- Silicon and Solar Cell Technologies
- Ferroelectric and Negative Capacitance Devices
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- Nanowire Synthesis and Applications
Papers in
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- Semiconductor materials and devices 4
- Integrated Circuits and Semiconductor Failure Analysis 2
- Advancements in Semiconductor Devices and Circuit Design 2
- Low-power high-performance VLSI design 1
- Plasma Diagnostics and Applications 1
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- Ion-surface interactions and analysis 3
- Co-authors
- C. Kenyon (2 shared papers)T. Ghani (2 shared papers)M. Bohr (2 shared papers)C. Auth (1 shared paper)B. McIntyre (1 shared paper)Kevin B. Johnson (1 shared paper)K. Mistry (1 shared paper)J. Sandford (1 shared paper)
- Journals
- Radiation effects and defects in solids (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (1 paper)Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena (1 paper)
- Partner nations
- United StatesCzechiaUzbekistan
In The Last Decade
P. Charvát
4 papers receiving 384 citations
Peers
Comparison fields: 5 of 25
- Electrical and Electronic Engineering 391
- Biomedical Engineering 93
- Structural Biology 3
- Atomic and Molecular Physics, and Optics 57
- Hardware and Architecture 9
Countries citing papers authored by P. Charvát
This map shows the geographic impact of P. Charvát's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Charvát with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Charvát more than expected).
Fields of papers citing papers by P. Charvát
This network shows the impact of papers produced by P. Charvát. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Charvát. The network helps show where P. Charvát may publish in the future.
Co-authors
The 25 scholars most cited alongside P. Charvát, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 380 | |
| 2 | 2003 | 17 | |
| 3 | 1992 | 13 | |
| 4 | 1986 | 4 | |
| 5 | 1991 | 0 |
About P. Charvát
P. Charvát is a scholar working on Electrical and Electronic Engineering, Computational Mechanics, Radiation, Biomedical Engineering and Infectious Diseases, having authored 5 papers that have together received 414 indexed citations. Recurring topics across this work include Semiconductor materials and devices (4 papers), Ion-surface interactions and analysis (3 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers), Advancements in Semiconductor Devices and Circuit Design (2 papers), Nanowire Synthesis and Applications (1 paper), Nuclear Physics and Applications (1 paper), Low-power high-performance VLSI design (1 paper) and Plasma Diagnostics and Applications (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (391 citations), Biomedical Engineering (93 citations), Structural Biology (3 citations), Atomic and Molecular Physics, and Optics (57 citations) and Hardware and Architecture (9 citations). P. Charvát has collaborated with scholars based in United States, Czechia and Uzbekistan. Frequent co-authors include C. Kenyon, T. Ghani, M. Bohr, C. Auth, B. McIntyre, Kevin B. Johnson, K. Mistry, J. Sandford, M. Bost and M Armstrong. Their work appears in journals such as Radiation effects and defects in solids, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena and Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.