J. C. Barbé
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Silicon Carbide Semiconductor Technologies
- Ferroelectric and Negative Capacitance Devices
- Integrated Circuits and Semiconductor Failure Analysis
- 3D IC and TSV technologies
- Thin-Film Transistor Technologies
Papers in
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- Semiconductor materials and devices 18
- Advancements in Semiconductor Devices and Circuit Design 17
- Integrated Circuits and Semiconductor Failure Analysis 5
- Silicon Carbide Semiconductor Technologies 3
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- Nanowire Synthesis and Applications 3
- Advanced Sensor Technologies Research 3
- Co-authors
- O. Rozeau (9 shared papers)S. Martinie (7 shared papers)M. Vinet (4 shared papers)J. Lacord (7 shared papers)T. Poiroux (6 shared papers)Sylvain Barraud (5 shared papers)M.-A. Jaud (3 shared papers)A. Juge (3 shared papers)
- Journals
- IEEE Transactions on Electron Devices (3 papers)Metrologia (3 papers)Solid-State Electronics (1 paper)Journal of Computational Electronics (1 paper)Microelectronics Reliability (1 paper)
- Partner nations
- FranceSwitzerlandUnited States
In The Last Decade
J. C. Barbé
30 papers receiving 341 citations
Peers
Comparison fields: 5 of 37
- Electrical and Electronic Engineering 310
- Statistics, Probability and Uncertainty 18
- Biomedical Engineering 83
- Atomic and Molecular Physics, and Optics 32
- Mechanics of Materials 18
Countries citing papers authored by J. C. Barbé
This map shows the geographic impact of J. C. Barbé's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. C. Barbé with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. C. Barbé more than expected).
Fields of papers citing papers by J. C. Barbé
This network shows the impact of papers produced by J. C. Barbé. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. C. Barbé. The network helps show where J. C. Barbé may publish in the future.
Co-authors
The 25 scholars most cited alongside J. C. Barbé, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 30 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2017 | 114 | |
| 2 | 2015 | 39 | |
| 3 | 2015 | 36 | |
| 4 | 2013 | 18 | |
| 5 | 2004 | 14 | |
| 6 | 2016 | 14 | |
| 7 | 2015 | 12 | |
| 8 | 2002 | 12 | |
| 9 | 2014 | 9 | |
| 10 | 2019 | 8 | |
| 11 | 2006 | 7 | |
| 12 | 2013 | 6 | |
| 13 | 2017 | 6 | |
| 14 | 2014 | 6 | |
| 15 | 2007 | 6 | |
| 16 | 2016 | 5 | |
| 17 | 2010 | 5 | |
| 18 | 2008 | 5 | |
| 19 | 2006 | 5 | |
| 20 | 2004 | 5 |
About J. C. Barbé
J. C. Barbé is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Statistics, Probability and Uncertainty, Mechanics of Materials and Materials Chemistry, having authored 30 papers that have together received 355 indexed citations. Recurring topics across this work include Semiconductor materials and devices (18 papers), Advancements in Semiconductor Devices and Circuit Design (17 papers), Scientific Measurement and Uncertainty Evaluation (6 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), Flow Measurement and Analysis (4 papers), Silicon Carbide Semiconductor Technologies (3 papers), Nanowire Synthesis and Applications (3 papers) and Advanced Sensor Technologies Research (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (310 citations), Statistics, Probability and Uncertainty (18 citations), Biomedical Engineering (83 citations), Atomic and Molecular Physics, and Optics (32 citations) and Mechanics of Materials (18 citations). J. C. Barbé has collaborated with scholars based in France, Switzerland and United States. Frequent co-authors include O. Rozeau, S. Martinie, M. Vinet, J. Lacord, T. Poiroux, Sylvain Barraud, M.-A. Jaud, A. Juge, P. Scheer and M. Minondo. Their work appears in journals such as IEEE Transactions on Electron Devices, Metrologia, Solid-State Electronics, Journal of Computational Electronics and Microelectronics Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.