D. Blachier
Impact in
-
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Thin-Film Transistor Technologies
- Ferroelectric and Negative Capacitance Devices
- Silicon Carbide Semiconductor Technologies
-
- GaN-based semiconductor devices and materials
Papers in
-
- Semiconductor materials and devices 17
- Integrated Circuits and Semiconductor Failure Analysis 11
- Advancements in Semiconductor Devices and Circuit Design 10
- Electrostatic Discharge in Electronics 3
- Thin-Film Transistor Technologies 2
-
- GaN-based semiconductor devices and materials 5
- Co-authors
- G. Reimbold (14 shared papers)C. Leroux (5 shared papers)M. Cassé (2 shared papers)F. Boulanger (2 shared papers)C. Le Royer (3 shared papers)Matthew Charles (5 shared papers)G. Guégan (3 shared papers)O. Faynot (2 shared papers)
- Journals
- Microelectronic Engineering (5 papers)Journal of Crystal Growth (2 papers)Solid-State Electronics (2 papers)IEEE Transactions on Device and Materials Reliability (1 paper)IEEE Electron Device Letters (1 paper)
- Partner nations
- FranceUnited StatesSwitzerland
In The Last Decade
D. Blachier
23 papers receiving 156 citations
Peers
Comparison fields: 5 of 27
- Electrical and Electronic Engineering 151
- Condensed Matter Physics 20
- Biomedical Engineering 38
- Structural Biology 1
- Electronic, Optical and Magnetic Materials 12
Countries citing papers authored by D. Blachier
This map shows the geographic impact of D. Blachier's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Blachier with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Blachier more than expected).
Fields of papers citing papers by D. Blachier
This network shows the impact of papers produced by D. Blachier. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Blachier. The network helps show where D. Blachier may publish in the future.
Co-authors
The 25 scholars most cited alongside D. Blachier, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 23 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1997 | 25 | |
| 2 | 2008 | 17 | |
| 3 | 2007 | 14 | |
| 4 | 2016 | 13 | |
| 5 | 2017 | 12 | |
| 6 | 2012 | 9 | |
| 7 | 1999 | 9 | |
| 8 | 2020 | 8 | |
| 9 | 2008 | 7 | |
| 10 | 1998 | 6 | |
| 11 | 2003 | 5 | |
| 12 | 2013 | 5 | |
| 13 | 2019 | 5 | |
| 14 | 2002 | 5 | |
| 15 | 1999 | 4 | |
| 16 | 2019 | 4 | |
| 17 | 2013 | 4 | |
| 18 | 1997 | 3 | |
| 19 | 2002 | 3 | |
| 20 | 2019 | 3 |
About D. Blachier
D. Blachier is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials and Biomedical Engineering, having authored 23 papers that have together received 165 indexed citations. Recurring topics across this work include Semiconductor materials and devices (17 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers), GaN-based semiconductor devices and materials (5 papers), Semiconductor Quantum Structures and Devices (5 papers), Electrostatic Discharge in Electronics (3 papers), Nanowire Synthesis and Applications (2 papers) and Thin-Film Transistor Technologies (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (151 citations), Condensed Matter Physics (20 citations), Biomedical Engineering (38 citations), Structural Biology (1 citation) and Electronic, Optical and Magnetic Materials (12 citations). D. Blachier has collaborated with scholars based in France, United States and Switzerland. Frequent co-authors include G. Reimbold, C. Leroux, M. Cassé, F. Boulanger, C. Le Royer, Matthew Charles, G. Guégan, O. Faynot, M. Bonis and L. Clavelier. Their work appears in journals such as Microelectronic Engineering, Journal of Crystal Growth, Solid-State Electronics, IEEE Transactions on Device and Materials Reliability and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.