Thomas Aichinger
Impact in
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- Silicon Carbide Semiconductor Technologies
- Semiconductor materials and devices
- Radiation Effects in Electronics
- Low-power high-performance VLSI design
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Hardware and Architecture top 10%
Papers in
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- Silicon Carbide Semiconductor Technologies 67
- Semiconductor materials and devices 21
- Integrated Circuits and Semiconductor Failure Analysis 3
- Electrostatic Discharge in Electronics 1
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- Quantum and electron transport phenomena 3
- Co-authors
- Tibor Grasser (37 shared papers)Gregor Pobegen A (37 shared papers)H. Reisinger (19 shared papers)Gerald Rescher (18 shared papers)Michael Nelhiebel (21 shared papers)Katja Puschkarsky (6 shared papers)Wolfgang Gustin (14 shared papers)Dethard Peters (12 shared papers)
- Journals
- IEEE Transactions on Electron Devices (9 papers)Applied Physics Letters (6 papers)Microelectronics Reliability (6 papers)Journal of Applied Physics (5 papers)IEEE Transactions on Device and Materials Reliability (4 papers)
- Partner nations
- AustriaGermanyUnited States
In The Last Decade
Thomas Aichinger
88 papers receiving 2.4k citations
Thomas Aichinger's Hit Papers
Peers
Comparison fields: 5 of 30
- Electrical and Electronic Engineering 2.3k
- Hardware and Architecture 43
- Condensed Matter Physics 36
- Safety, Risk, Reliability and Quality 28
- Materials Chemistry 64
Countries citing papers authored by Thomas Aichinger
This map shows the geographic impact of Thomas Aichinger's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thomas Aichinger with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thomas Aichinger more than expected).
Fields of papers citing papers by Thomas Aichinger
This network shows the impact of papers produced by Thomas Aichinger. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thomas Aichinger. The network helps show where Thomas Aichinger may publish in the future.
Co-authors
The 25 scholars most cited alongside Thomas Aichinger, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 91 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps Hit paper breakdown → | 2011 | 408 |
| 2 | 2017 | 221 | |
| 3 | 2019 | 175 | |
| 4 | 2017 | 124 | |
| 5 | 2018 | 100 | |
| 6 | 2018 | 81 | |
| 7 | 2016 | 66 | |
| 8 | 2017 | 65 | |
| 9 | 2020 | 47 | |
| 10 | 2023 | 47 | |
| 11 | 2018 | 46 | |
| 12 | 2018 | 45 | |
| 13 | 2009 | 44 | |
| 14 | 2008 | 42 | |
| 15 | 2012 | 40 | |
| 16 | 2009 | 36 | |
| 17 | 2011 | 36 | |
| 18 | 2022 | 35 | |
| 19 | 2017 | 32 | |
| 20 | 2023 | 31 |
About Thomas Aichinger
Thomas Aichinger is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Software, Biophysics and Hardware and Architecture, having authored 91 papers that have together received 2.4k indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (67 papers), Semiconductor materials and devices (21 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Quantum and electron transport phenomena (3 papers), Diamond and Carbon-based Materials Research (2 papers), Electrostatic Discharge in Electronics (1 paper), VLSI and Analog Circuit Testing (1 paper) and Software Testing and Debugging Techniques (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (2.3k citations), Hardware and Architecture (43 citations), Condensed Matter Physics (36 citations), Safety, Risk, Reliability and Quality (28 citations) and Materials Chemistry (64 citations). Thomas Aichinger has collaborated with scholars based in Austria, Germany and United States. Frequent co-authors include Tibor Grasser, Gregor Pobegen A, H. Reisinger, Gerald Rescher, Michael Nelhiebel, Katja Puschkarsky, Wolfgang Gustin, Dethard Peters, Thomas Basler and Wolfgang Goes. Their work appears in journals such as IEEE Transactions on Electron Devices, Applied Physics Letters, Microelectronics Reliability, Journal of Applied Physics and IEEE Transactions on Device and Materials Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.