F. Schanovsky
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
- Radiation Effects in Electronics
- Silicon Carbide Semiconductor Technologies
- Integrated Circuits and Semiconductor Failure Analysis
- Bioengineering top 10%
Papers in
-
- Semiconductor materials and devices 34
- Advancements in Semiconductor Devices and Circuit Design 23
- Low-power high-performance VLSI design 6
- Ferroelectric and Negative Capacitance Devices 6
- Co-authors
- Tibor Grasser (28 shared papers)Wolfgang Goes (16 shared papers)H. Reisinger (10 shared papers)B. Kaczer (14 shared papers)P.-J. Wagner (3 shared papers)Michael Nelhiebel (2 shared papers)Jacopo Franco (3 shared papers)María Toledano Luque (2 shared papers)
- Journals
- IEEE Transactions on Electron Devices (7 papers)Journal of Computational Electronics (2 papers)IEEE Journal of the Electron Devices Society (1 paper)Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena (1 paper)IEEE Electron Device Letters (1 paper)
In The Last Decade
F. Schanovsky
59 papers receiving 1.4k citations
F. Schanovsky's Hit Papers
Peers
Comparison fields: 5 of 28
- Electrical and Electronic Engineering 1.3k
- Bioengineering 19
- Hardware and Architecture 59
- Materials Chemistry 103
- Safety, Risk, Reliability and Quality 14
Countries citing papers authored by F. Schanovsky
This map shows the geographic impact of F. Schanovsky's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Schanovsky with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Schanovsky more than expected).
Fields of papers citing papers by F. Schanovsky
This network shows the impact of papers produced by F. Schanovsky. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Schanovsky. The network helps show where F. Schanovsky may publish in the future.
Co-authors
The 25 scholars most cited alongside F. Schanovsky, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 62 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps Hit paper breakdown → | 2011 | 408 |
| 2 | 2010 | 256 | |
| 3 | 2010 | 94 | |
| 4 | 2014 | 89 | |
| 5 | 2018 | 66 | |
| 6 | NBTI in Nanoscale MOSFETs—The Ultimate Modeling Benchmark | 2016 | 45 |
| 7 | 2013 | 38 | |
| 8 | 2011 | 36 | |
| 9 | 2013 | 35 | |
| 10 | 2016 | 31 | |
| 11 | 2021 | 27 | |
| 12 | 2021 | 19 | |
| 13 | 2012 | 18 | |
| 14 | 2013 | 15 | |
| 15 | 2010 | 13 | |
| 16 | 2020 | 13 | |
| 17 | 2022 | 12 | |
| 18 | 2012 | 11 | |
| 19 | 2018 | 11 | |
| 20 | 2023 | 11 |
About F. Schanovsky
F. Schanovsky is a scholar working on Electrical and Electronic Engineering, Bioengineering, Materials Chemistry, Atomic and Molecular Physics, and Optics and Statistical and Nonlinear Physics, having authored 62 papers that have together received 1.4k indexed citations. Recurring topics across this work include Semiconductor materials and devices (34 papers), Advancements in Semiconductor Devices and Circuit Design (23 papers), Low-power high-performance VLSI design (6 papers), Ferroelectric and Negative Capacitance Devices (6 papers), Semiconductor materials and interfaces (2 papers), 2D Materials and Applications (2 papers), Stochastic processes and statistical mechanics (1 paper) and stochastic dynamics and bifurcation (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (1.3k citations), Bioengineering (19 citations), Hardware and Architecture (59 citations), Materials Chemistry (103 citations) and Safety, Risk, Reliability and Quality (14 citations). F. Schanovsky has collaborated with scholars based in Austria, Belgium and Germany. Frequent co-authors include Tibor Grasser, Wolfgang Goes, H. Reisinger, B. Kaczer, P.-J. Wagner, Michael Nelhiebel, Jacopo Franco, María Toledano Luque, Thomas Aichinger and Michael Waltl. Their work appears in journals such as IEEE Transactions on Electron Devices, Journal of Computational Electronics, IEEE Journal of the Electron Devices Society, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.