Th. Aichinger
Impact in
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- Semiconductor materials and devices
- Low-power high-performance VLSI design
- Advancements in Semiconductor Devices and Circuit Design
- Radiation Effects in Electronics
- Silicon Carbide Semiconductor Technologies
- Integrated Circuits and Semiconductor Failure Analysis
- Hardware and Architecture top 10%
- VLSI and Analog Circuit Testing
Papers in
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- Semiconductor materials and devices 8
- Co-authors
- B. Kaczer (8 shared papers)Tibor Grasser (8 shared papers)Michael Nelhiebel (8 shared papers)Ph. Hehenberger (5 shared papers)Wolfgang Goes (4 shared papers)H. Reisinger (5 shared papers)P.-J. Wagner (5 shared papers)Gregor Pobegen A (2 shared papers)
- Journals
- Microelectronic Engineering (1 paper)IEEE International Reliability Physics Symposium proceedings (3 papers)IEEE International Integrated Reliability Workshop final report (1 paper)Technical digest - International Electron Devices Meeting/Technical digest (3 papers)
In The Last Decade
Th. Aichinger
8 papers receiving 678 citations
Peers
Comparison fields: 5 of 12
- Electrical and Electronic Engineering 652
- Hardware and Architecture 50
- Safety, Risk, Reliability and Quality 9
- Materials Chemistry 22
- Condensed Matter Physics 6
Countries citing papers authored by Th. Aichinger
This map shows the geographic impact of Th. Aichinger's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Th. Aichinger with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Th. Aichinger more than expected).
Fields of papers citing papers by Th. Aichinger
This network shows the impact of papers produced by Th. Aichinger. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Th. Aichinger. The network helps show where Th. Aichinger may publish in the future.
Co-authors
The 13 scholars most cited alongside Th. Aichinger, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2009 | 180 | |
| 2 | 2011 | 160 | |
| 3 | 2009 | 104 | |
| 4 | 2010 | 94 | |
| 5 | 2011 | 64 | |
| 6 | 2009 | 56 | |
| 7 | 2009 | 25 | |
| 8 | 2010 | 5 |
About Th. Aichinger
Th. Aichinger is a scholar working on Electrical and Electronic Engineering, Nuclear Energy and Engineering, Waste Management and Disposal, Infectious Diseases and Organic Chemistry, having authored 8 papers that have together received 688 indexed citations. Recurring topics across this work include Semiconductor materials and devices (8 papers). The work is most often cited by research in Electrical and Electronic Engineering (652 citations), Hardware and Architecture (50 citations), Safety, Risk, Reliability and Quality (9 citations), Materials Chemistry (22 citations) and Condensed Matter Physics (6 citations). Th. Aichinger has collaborated with scholars based in Belgium, Austria and Germany. Frequent co-authors include B. Kaczer, Tibor Grasser, Michael Nelhiebel, Ph. Hehenberger, Wolfgang Goes, H. Reisinger, P.-J. Wagner, Gregor Pobegen A, Jacopo Franco and Philippe J. Roussel. Their work appears in journals such as Microelectronic Engineering, IEEE International Reliability Physics Symposium proceedings, IEEE International Integrated Reliability Workshop final report and Technical digest - International Electron Devices Meeting/Technical digest.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.