C. Huffman
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Ferroelectric and Negative Capacitance Devices
- Integrated Circuits and Semiconductor Failure Analysis
- Plasma Diagnostics and Applications
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- Electronic and Structural Properties of Oxides
- 2D Materials and Applications
- MXene and MAX Phase Materials
Papers in
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- Semiconductor materials and devices 37
- Advancements in Semiconductor Devices and Circuit Design 13
- Integrated Circuits and Semiconductor Failure Analysis 11
- Ferroelectric and Negative Capacitance Devices 7
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- Copper Interconnects and Reliability 14
- Co-authors
- Young‐Hee Lee (1 shared paper)Steven M. George (1 shared paper)P. Majhi (13 shared papers)Husam N. Alshareef (9 shared papers)H.C. Wen (7 shared papers)Minhwan Jeon (1 shared paper)G.Y. Yeom (1 shared paper)Wei Han (1 shared paper)
- Journals
- Japanese Journal of Applied Physics (5 papers)Electrochemical and Solid-State Letters (3 papers)Thin Solid Films (2 papers)IEEE Electron Device Letters (2 papers)Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms (1 paper)
- Partner nations
- United StatesBelgiumJapan
In The Last Decade
C. Huffman
37 papers receiving 576 citations
Peers
Comparison fields: 5 of 33
- Electrical and Electronic Engineering 529
- Materials Chemistry 210
- Electronic, Optical and Magnetic Materials 72
- Mechanics of Materials 49
- Biomedical Engineering 72
Countries citing papers authored by C. Huffman
This map shows the geographic impact of C. Huffman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Huffman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Huffman more than expected).
Fields of papers citing papers by C. Huffman
This network shows the impact of papers produced by C. Huffman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Huffman. The network helps show where C. Huffman may publish in the future.
Co-authors
The 25 scholars most cited alongside C. Huffman, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 40 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2016 | 90 | |
| 2 | 2015 | 88 | |
| 3 | 2006 | 51 | |
| 4 | 2005 | 35 | |
| 5 | 1985 | 33 | |
| 6 | 2005 | 33 | |
| 7 | 2006 | 31 | |
| 8 | 2006 | 30 | |
| 9 | 2005 | 27 | |
| 10 | 2005 | 25 | |
| 11 | 2004 | 22 | |
| 12 | 2005 | 20 | |
| 13 | 2013 | 18 | |
| 14 | 2006 | 16 | |
| 15 | 2011 | 13 | |
| 16 | 2005 | 12 | |
| 17 | 2010 | 6 | |
| 18 | 1987 | 6 | |
| 19 | 2005 | 6 | |
| 20 | 1987 | 6 |
About C. Huffman
C. Huffman is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Mechanics of Materials, Atomic and Molecular Physics, and Optics and Materials Chemistry, having authored 40 papers that have together received 615 indexed citations. Recurring topics across this work include Semiconductor materials and devices (37 papers), Copper Interconnects and Reliability (14 papers), Advancements in Semiconductor Devices and Circuit Design (13 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Metal and Thin Film Mechanics (8 papers), Ferroelectric and Negative Capacitance Devices (7 papers), Semiconductor materials and interfaces (6 papers) and Electronic and Structural Properties of Oxides (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (529 citations), Materials Chemistry (210 citations), Electronic, Optical and Magnetic Materials (72 citations), Mechanics of Materials (49 citations) and Biomedical Engineering (72 citations). C. Huffman has collaborated with scholars based in United States, Belgium and Japan. Frequent co-authors include Young‐Hee Lee, Steven M. George, P. Majhi, Husam N. Alshareef, H.C. Wen, Minhwan Jeon, G.Y. Yeom, Wei Han, Baotao Kang and Joel Barnett. Their work appears in journals such as Japanese Journal of Applied Physics, Electrochemical and Solid-State Letters, Thin Solid Films, IEEE Electron Device Letters and Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.