Chenming Hu

35.7k citations
746 papers · 26.4k · 8 hit papers · h-index 79

Impact in

    • Semiconductor materials and devices
    • Advancements in Semiconductor Devices and Circuit Design
    • Ferroelectric and Negative Capacitance Devices
    • Integrated Circuits and Semiconductor Failure Analysis
    • Silicon Carbide Semiconductor Technologies
    • Advanced Memory and Neural Computing

Papers in

    • Semiconductor materials and devices 594
    • Advancements in Semiconductor Devices and Circuit Design 502
    • Silicon Carbide Semiconductor Technologies 149
    • Ferroelectric and Negative Capacitance Devices 135
    • Integrated Circuits and Semiconductor Failure Analysis 134
    • Advanced Memory and Neural Computing 48
    • Electrostatic Discharge in Electronics 46
    • MXene and MAX Phase Materials 44

Chenming Hu

727 papers receiving 25.0k citations

Chenming Hu's Hit Papers

MoS2transistors with 1-nanometer gate lengths 2016 · 1.2k citations
1.2k0+13+27Years since publication4008001.2k

Peers

Chenming Hu
Comparison fields: 5 of 126
  • Electrical and Electronic Engineering 24.1k
  • Hardware and Architecture 937
  • Materials Chemistry 5.7k
  • Electronic, Optical and Magnetic Materials 1.4k
  • Biomedical Engineering 2.8k
Replace Krishna C. Saraswat with:
Krishna C. Saraswat United States
G. Groeseneken Belgium
Kaustav Banerjee United States
Suman Datta United States
S.S. Wong United States
Daniel M. Fleetwood United States
Kenneth L. Shepard United States
Zhewei Jiang United States
Ronald D. Schrimpf United States
D.A. Antoniadis United States
Chenming Hu relative to Krishna C. Saraswat United States Krishna C. Saraswat's profile →
Citations per field
00.5×1.5×2.3×
Krishna C. Saraswat · 1×
Citations per year

Countries citing papers authored by Chenming Hu

Since Specialization
Citations

This map shows the geographic impact of Chenming Hu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Chenming Hu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Chenming Hu more than expected).

Fields of papers citing papers by Chenming Hu

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Chenming Hu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Chenming Hu. The network helps show where Chenming Hu may publish in the future.

Co-authors

The 25 scholars most cited alongside Chenming Hu, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Chenming Hu Line = papers co-authored together Chenming Hu links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 746 papers — load more, or switch the sort, to bring in the rest.

#Work
1
MoS2transistors with 1-nanometer gate lengths
Hit paper breakdown →
20161200
2
Hot-electron-induced MOSFET degradation—Model, monitor, and improvement
Hit paper breakdown →
1985891
3
A unified model for the flicker noise in metal-oxide-semiconductor field-effect transistors
Hit paper breakdown →
1990654
4
Field-Effect Transistors Built from All Two-Dimensional Material Components
Hit paper breakdown →
2014577
5
Electrical breakdown in thin gate and tunneling oxides
Hit paper breakdown →
1985404
6
New paradigm of predictive MOSFET and interconnect modeling for early circuit simulation
Hit paper breakdown →
2002398
7
Threshold voltage model for deep-submicrometer MOSFETs
Hit paper breakdown →
1993361
8
Metal-dielectric band alignment and its implications for metal gate complementary metal-oxide-semiconductor technology
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2002355
9 1997317
10 2007293
11 2019287
12 1984273
13 2016272
14 2003270
15 1973261
16 2015252
17 1987232
18 1990230
19 2001224
20 2003202

About Chenming Hu

Chenming Hu is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics, Biomedical Engineering and Electronic, Optical and Magnetic Materials, having authored 746 papers that have together received 26.4k indexed citations. Recurring topics across this work include Semiconductor materials and devices (594 papers), Advancements in Semiconductor Devices and Circuit Design (502 papers), Silicon Carbide Semiconductor Technologies (149 papers), Ferroelectric and Negative Capacitance Devices (135 papers), Integrated Circuits and Semiconductor Failure Analysis (134 papers), Advanced Memory and Neural Computing (48 papers), Electrostatic Discharge in Electronics (46 papers) and MXene and MAX Phase Materials (44 papers). The work is most often cited by research in Electrical and Electronic Engineering (24.1k citations), Hardware and Architecture (937 citations), Materials Chemistry (5.7k citations), Electronic, Optical and Magnetic Materials (1.4k citations) and Biomedical Engineering (2.8k citations). Chenming Hu has collaborated with scholars based in United States, Italy and Taiwan. Frequent co-authors include P.K. Ko, P.K. Ko, Sayeef Salahuddin, Angada B. Sachid, Jeffrey Bokor, Kuo-Hsiang Hung, Ping-Keung Ko, T.Y. Chan, Ali Javey and S. Holland. Their work appears in journals such as IEEE Electron Device Letters, IEEE Transactions on Electron Devices, Solid-State Electronics, Applied Physics Letters and IEEE Journal of Solid-State Circuits.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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