W. Lai
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Radiation Effects in Electronics
- Electrostatic Discharge in Electronics
- Hardware and Architecture top 10%
Papers in
-
- Semiconductor materials and devices 22
- Advancements in Semiconductor Devices and Circuit Design 18
- Integrated Circuits and Semiconductor Failure Analysis 15
- Ferroelectric and Negative Capacitance Devices 4
- Advanced Memory and Neural Computing 3
- Low-power high-performance VLSI design 1
-
- Electronic and Structural Properties of Oxides 4
- Co-authors
- Ernest Y. Wu (16 shared papers)J. Suñé (13 shared papers)E. Nowak (8 shared papers)A. Vayshenker (7 shared papers)D. Harmon (9 shared papers)J. A. McKenna (4 shared papers)R.‐P. Vollertsen (2 shared papers)B.P. Linder (3 shared papers)
- Journals
- Microelectronic Engineering (3 papers)Microelectronics Reliability (3 papers)IEEE Transactions on Electron Devices (3 papers)IBM Journal of Research and Development (1 paper)IEEE Electron Device Letters (1 paper)
- Partner nations
- United StatesSpainSouth Korea
In The Last Decade
W. Lai
24 papers receiving 543 citations
Peers
Comparison fields: 5 of 32
- Electrical and Electronic Engineering 547
- Hardware and Architecture 37
- Electronic, Optical and Magnetic Materials 61
- Materials Chemistry 74
- Computer Networks and Communications 27
Countries citing papers authored by W. Lai
This map shows the geographic impact of W. Lai's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W. Lai with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W. Lai more than expected).
Fields of papers citing papers by W. Lai
This network shows the impact of papers produced by W. Lai. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W. Lai. The network helps show where W. Lai may publish in the future.
Co-authors
The 25 scholars most cited alongside W. Lai, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 24 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 116 | |
| 2 | 2002 | 93 | |
| 3 | 2002 | 62 | |
| 4 | 2006 | 37 | |
| 5 | 2004 | 34 | |
| 6 | 2004 | 29 | |
| 7 | 2003 | 25 | |
| 8 | 2001 | 22 | |
| 9 | 2003 | 21 | |
| 10 | 2004 | 19 | |
| 11 | 2001 | 15 | |
| 12 | 2006 | 14 | |
| 13 | 2003 | 14 | |
| 14 | 2014 | 12 | |
| 15 | 2013 | 12 | |
| 16 | 2002 | 12 | |
| 17 | 2014 | 7 | |
| 18 | 2004 | 6 | |
| 19 | 2002 | 5 | |
| 20 | 2004 | 5 |
About W. Lai
W. Lai is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Hardware and Architecture, Electronic, Optical and Magnetic Materials and Infectious Diseases, having authored 24 papers that have together received 569 indexed citations. Recurring topics across this work include Semiconductor materials and devices (22 papers), Advancements in Semiconductor Devices and Circuit Design (18 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers), Ferroelectric and Negative Capacitance Devices (4 papers), Electronic and Structural Properties of Oxides (4 papers), Advanced Memory and Neural Computing (3 papers), Copper Interconnects and Reliability (1 paper) and Low-power high-performance VLSI design (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (547 citations), Hardware and Architecture (37 citations), Electronic, Optical and Magnetic Materials (61 citations), Materials Chemistry (74 citations) and Computer Networks and Communications (27 citations). W. Lai has collaborated with scholars based in United States, Spain and South Korea. Frequent co-authors include Ernest Y. Wu, J. Suñé, E. Nowak, A. Vayshenker, D. Harmon, J. A. McKenna, R.‐P. Vollertsen, B.P. Linder, David Jiménez and James McKenna. Their work appears in journals such as Microelectronic Engineering, Microelectronics Reliability, IEEE Transactions on Electron Devices, IBM Journal of Research and Development and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.