Tom Schram
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Ferroelectric and Negative Capacitance Devices
- Integrated Circuits and Semiconductor Failure Analysis
- Materials Chemistry top 5%
- 2D Materials and Applications
- Electronic and Structural Properties of Oxides
Papers in
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- Semiconductor materials and devices 184
- Advancements in Semiconductor Devices and Circuit Design 137
- Integrated Circuits and Semiconductor Failure Analysis 67
- Ferroelectric and Negative Capacitance Devices 56
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- Semiconductor materials and interfaces 26
- Co-authors
- Stefan De Gendt (43 shared papers)L. Pantisano (22 shared papers)Marc Heyns (16 shared papers)Herman A. Terryn (10 shared papers)G. Groeseneken (27 shared papers)Naoto Horiguchi (52 shared papers)Lars-Åke Ragnarsson (34 shared papers)Michel Houssa (9 shared papers)
- Journals
- Microelectronic Engineering (14 papers)IEEE Transactions on Electron Devices (12 papers)IEEE Electron Device Letters (9 papers)Applied Physics Letters (9 papers)Journal of The Electrochemical Society (6 papers)
- Partner nations
- BelgiumUnited StatesSouth Korea
In The Last Decade
Tom Schram
218 papers receiving 3.5k citations
Peers
Comparison fields: 5 of 61
- Electrical and Electronic Engineering 3.1k
- Materials Chemistry 1.1k
- Atomic and Molecular Physics, and Optics 540
- Electronic, Optical and Magnetic Materials 224
- Biomedical Engineering 443
Countries citing papers authored by Tom Schram
This map shows the geographic impact of Tom Schram's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Tom Schram with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Tom Schram more than expected).
Fields of papers citing papers by Tom Schram
This network shows the impact of papers produced by Tom Schram. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Tom Schram. The network helps show where Tom Schram may publish in the future.
Co-authors
The 25 scholars most cited alongside Tom Schram, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 221 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2006 | 237 | |
| 2 | 2016 | 171 | |
| 3 | 2016 | 137 | |
| 4 | 2003 | 109 | |
| 5 | 2003 | 94 | |
| 6 | 2001 | 89 | |
| 7 | 2018 | 85 | |
| 8 | 2018 | 71 | |
| 9 | 2015 | 68 | |
| 10 | 2022 | 65 | |
| 11 | 2006 | 60 | |
| 12 | 1995 | 52 | |
| 13 | 2011 | 52 | |
| 14 | 2011 | 52 | |
| 15 | 2009 | 49 | |
| 16 | 2014 | 49 | |
| 17 | 2005 | 47 | |
| 18 | 2017 | 47 | |
| 19 | 2020 | 46 | |
| 20 | 2006 | 43 |
About Tom Schram
Tom Schram is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Electronic, Optical and Magnetic Materials and Mechanics of Materials, having authored 221 papers that have together received 3.6k indexed citations. Recurring topics across this work include Semiconductor materials and devices (184 papers), Advancements in Semiconductor Devices and Circuit Design (137 papers), Integrated Circuits and Semiconductor Failure Analysis (67 papers), Ferroelectric and Negative Capacitance Devices (56 papers), Semiconductor materials and interfaces (26 papers), 2D Materials and Applications (17 papers), Copper Interconnects and Reliability (16 papers) and Metal and Thin Film Mechanics (16 papers). The work is most often cited by research in Electrical and Electronic Engineering (3.1k citations), Materials Chemistry (1.1k citations), Atomic and Molecular Physics, and Optics (540 citations), Electronic, Optical and Magnetic Materials (224 citations) and Biomedical Engineering (443 citations). Tom Schram has collaborated with scholars based in Belgium, United States and South Korea. Frequent co-authors include Stefan De Gendt, L. Pantisano, Marc Heyns, Herman A. Terryn, G. Groeseneken, Naoto Horiguchi, Lars-Åke Ragnarsson, Michel Houssa, R. Ritzenthaler and Kristin De Meyer. Their work appears in journals such as Microelectronic Engineering, IEEE Transactions on Electron Devices, IEEE Electron Device Letters, Applied Physics Letters and Journal of The Electrochemical Society.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.