M. Tack

1.6k citations

84 papers · 1.3k · h-index 19

Impact in

Condensed Matter Physics top 2%
- GaN-based semiconductor devices and materials
Electrical and Electronic Engineering top 5%
- Semiconductor materials and devices
- Silicon Carbide Semiconductor Technologies
- Advancements in Semiconductor Devices and Circuit Design
- Electrostatic Discharge in Electronics
- Integrated Circuits and Semiconductor Failure Analysis

Papers in

Electrical and Electronic Engineering 81
- Silicon Carbide Semiconductor Technologies 53
- Semiconductor materials and devices 51
- Advancements in Semiconductor Devices and Circuit Design 50
- Electrostatic Discharge in Electronics 16
- Low-power high-performance VLSI design 6
- Electromagnetic Compatibility and Noise Suppression 5
- Integrated Circuits and Semiconductor Failure Analysis 4
Condensed Matter Physics 22
- GaN-based semiconductor devices and materials 22

Co-authors: P. Moens (48 shared papers)F. Bauwens (21 shared papers)G. Groeseneken (3 shared papers)Cor Claeys (4 shared papers)P. Coppens (10 shared papers)P. Vanmeerbeek (14 shared papers)R. Degraeve (2 shared papers)J. Roig (15 shared papers)
Journals: IEEE Transactions on Electron Devices (6 papers)IEEE Electron Device Letters (4 papers)Microelectronics Reliability (3 papers)IEEE Transactions on Industrial Electronics (1 paper)IEEE Transactions on Device and Materials Reliability (1 paper)
Partner nations: Belgium United States Italy

In The Last Decade

M. Tack

79 papers receiving 1.3k citations

Peers

Countries citing papers authored by M. Tack

Since Specialization

Citations

This map shows the geographic impact of M. Tack's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Tack with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Tack more than expected).

Fields of papers citing papers by M. Tack

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Tack. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Tack. The network helps show where M. Tack may publish in the future.

Co-authors

The 25 scholars most cited alongside M. Tack, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M. Tack Line = papers co-authored together M. Tack links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 84 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	On the impact of carbon-doping on the dynamic Ron and off-state leakage current of 650V GaN power devices Research Padua Archive (University of Padua) ·P. Moens, P. Vanmeerbeek, Abhishek Banerjee, J. Guo, C. Liu, P. Coppens, Amar K. Salih, M. Tack, Markus Caesar, Michael J. Uren, Martin Kuball, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni	2015	99
2	An industry-ready 200 mm p-GaN E-mode GaN-on-Si power technology Niels Posthuma, Shuzhen You, Steve Stoffels, D. Wellekens, H. Liang, Ming Zhao, Brice De Jaeger, Karen Geens, N. Ronchi, Stefaan Decoutere, P. Moens, Abhishek Banerjee, H. Ziad, M. Tack	2018	98
3	An industrial process for 650V rated GaN-on-Si power devices using in-situ SiN as a gate dielectric P. Moens, C. Liu, Abhishek Banerjee, P. Vanmeerbeek, P. Coppens, H. Ziad, A. Constant, Z. Li, Herbert De Vleeschouwer, Jaume Roig-Guitart, P. Gassot, F. Bauwens, E. De Backer, Balaji Padmanabhan, Ali Salih, J. M. Parsey, M. Tack	2014	92
4	Short-Circuit Study in Medium-Voltage GaN Cascodes, p-GaN HEMTs, and GaN MISHEMTs IEEE Transactions on Industrial Electronics ·M. Fernández, X. Perpiñà, Jaume Roig-Guitart, M. Vellvehı́, F. Bauwens, M. Tack, X. Jordà	2017	77
5	Impact of buffer leakage on intrinsic reliability of 650V AlGaN/GaN HEMTs Bristol Research (University of Bristol) ·P. Moens, Abhishek Banerjee, Michael J. Uren, Matteo Meneghini, Serge Karboyan, Indranil Chatterjee, P. Vanmeerbeek, Markus Cäsar, C. Liu, Ali Salih, Enrico Zanoni, Gaudenzio Meneghesso, Martin Kuball, M. Tack	2015	74
6	Hot Hole Degradation Effects in Lateral nDMOS Transistors IEEE Transactions on Electron Devices ·P. Moens, G. Vandenbosch, C. DeKeukeleire, R. Degraeve, M. Tack, G. Groeseneken	2004	63
7	A Comprehensive Model for Hot Carrier Degradation in LDMOS Transistors P. Moens, Johann Mertens, F. Bauwens, Pierre Joris, W. De Ceuninck, M. Tack	2007	56
8	Characterization of front and back Si-SiO/sub 2/ interfaces in thick- and thin-film silicon-on-insulator MOS structures by the charge-pumping technique IEEE Transactions on Electron Devices ·Dirk J. Wouters, M. Tack, G. Groeseneken, H.E. Maes, Cor Claeys	1989	53
9	P-GaN HEMTs Drain and Gate Current Analysis Under Short-Circuit IEEE Electron Device Letters ·M. Fernández, X. Perpiñà, J. Roig, M. Vellvehı́, F. Bauwens, X. Jordà, M. Tack	2017	51
10	A novel hot-hole injection degradation model for lateral nDMOS transistors P. Moens, M. Tack, R. Degraeve, G. Groeseneken	2002	48
11	XtreMOS : The First Integrated Power Transistor Breaking the Silicon Limit P. Moens, F. Bauwens, J. Baele, Konstantin Vershinin, E. De Backer, E.M. Sankara Narayanan, M. Tack	2006	45
12	The multistable charge-controlled memory effect in SOI MOS transistors at low temperatures IEEE Transactions on Electron Devices ·M. Tack, M.-H. Gao, Cor Claeys, G. Declerck	1990	44
13	Impact of Ti/Al atomic ratio on the formation mechanism of non-recessed Au-free Ohmic contacts on AlGaN/GaN heterostructures Journal of Applied Physics ·A. Constant, J. Baele, P. Coppens, Wentao Qin, H. Ziad, E. De Backer, P. Moens, M. Tack	2016	35
14	Electron trapping and interface trap generation in drain extended pMOS transistors P. Moens, F. Bauwens, Matthew D. Nelson, M. Tack	2005	32
15	I3T80: a 0.35 μm based system-on-chip technology for 42 V battery automotive applications P. Moens, D. Bolognesi, L. Delobel, Daniel Villanueva, Hedi Hakim, Stephanie Trinh, K. Reynders, F. De Pestel, A. Lowe, E. De Backer, G. Van Herzeele, M. Tack	2003	29
16	Development of a robust 50V 0.35 μm based Smart Power Technology using trench isolation F. De Pestel, P. Moens, Hedi Hakim, Herbert De Vleeschouwer, K. Reynders, Tony Colpaert, P. Colson, P. Coppens, Sylvie Boonen, D. Bolognesi, M. Tack	2004	25
17	Stress-Induced Mobility Enhancement for Integrated Power Transistors P. Moens, J. Roig, Francesca Clemente, Ingrid De Wolf, B. Desoete, F. Bauwens, M. Tack	2007	23
18	UltiMOS: A local charge-balanced trench-based 600V super-junction device P. Moens, F. Bogman, H. Ziad, Herbert De Vleeschouwer, J. Baele, M. Tack, G. H. Loechelt, Gordy Grivna, J. M. Parsey, Yi Wu, Tanvir Quddus, P. Zdebel	2011	22
19	Negative dynamic Ron in AlGaN/GaN power devices Bristol Research (University of Bristol) ·P. Moens, Michael J. Uren, Abhishek Banerjee, Matteo Meneghini, Balaji Padmanabhan, Woochul Jeon, Serge Karboyan, Martin Kuball, Gaudenzio Meneghesso, Enrico Zanoni, M. Tack	2017	21
20	Plasma-Charging Damage of Floating MIM Capacitors IEEE Transactions on Electron Devices ·Z. Wang, J. Ackaert, Cora Salm, F.G. Kuper, M. Tack, (unknown), P. Coppens, L. DeSchepper, Basil Vlachakis	2004	18

About M. Tack

M. Tack is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Materials Chemistry and Atomic and Molecular Physics, and Optics, having authored 84 papers that have together received 1.3k indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (53 papers), Semiconductor materials and devices (51 papers), Advancements in Semiconductor Devices and Circuit Design (50 papers), GaN-based semiconductor devices and materials (22 papers), Electrostatic Discharge in Electronics (16 papers), Low-power high-performance VLSI design (6 papers), Electromagnetic Compatibility and Noise Suppression (5 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers). The work is most often cited by research in Condensed Matter Physics (599 citations), Electrical and Electronic Engineering (1.2k citations), Electronic, Optical and Magnetic Materials (201 citations), Atomic and Molecular Physics, and Optics (127 citations) and Hardware and Architecture (21 citations). M. Tack has collaborated with scholars based in Belgium, United States and Italy. Frequent co-authors include P. Moens, F. Bauwens, G. Groeseneken, Cor Claeys, P. Coppens, P. Vanmeerbeek, R. Degraeve, J. Roig, Abhishek Banerjee and H. Ziad. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Electron Device Letters, Microelectronics Reliability, IEEE Transactions on Industrial Electronics and IEEE Transactions on Device and Materials Reliability.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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