I. Babich
Impact in
- Surfaces, Coatings and Films top 10%
-
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Photolithography Techniques
Papers in
-
- Advancements in Photolithography Techniques 9
- Semiconductor materials and devices 4
- Advancements in Semiconductor Devices and Circuit Design 3
-
- Electron and X-Ray Spectroscopy Techniques 6
- Co-authors
- K.W. Guarini (6 shared papers)E. Sikorski (5 shared papers)Charles T. Black (4 shared papers)Hansoo Kim (2 shared papers)M. Ieong (2 shared papers)Huiling Shang (1 shared paper)Wilfried Haensch (1 shared paper)P. Kozlowski (1 shared paper)
- Journals
- Microelectronic Engineering (4 papers)IEEE Electron Device Letters (2 papers)IBM Journal of Research and Development (1 paper)Journal of materials research/Pratt's guide to venture capital sources (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (3 papers)
- Partner nations
- United States
In The Last Decade
I. Babich
16 papers receiving 541 citations
Peers
Comparison fields: 5 of 30
- Surfaces, Coatings and Films 61
- Electrical and Electronic Engineering 399
- Materials Chemistry 248
- Biomedical Engineering 175
- Atomic and Molecular Physics, and Optics 99
Countries citing papers authored by I. Babich
This map shows the geographic impact of I. Babich's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by I. Babich with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites I. Babich more than expected).
Fields of papers citing papers by I. Babich
This network shows the impact of papers produced by I. Babich. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by I. Babich. The network helps show where I. Babich may publish in the future.
Co-authors
The 25 scholars most cited alongside I. Babich, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 143 | |
| 2 | 2002 | 121 | |
| 3 | 2004 | 114 | |
| 4 | 2004 | 84 | |
| 5 | 2004 | 28 | |
| 6 | 1998 | 17 | |
| 7 | 2006 | 14 | |
| 8 | 2006 | 12 | |
| 9 | 1988 | 11 | |
| 10 | 2005 | 10 | |
| 11 | 1988 | 8 | |
| 12 | 1991 | 5 | |
| 13 | 1998 | 4 | |
| 14 | 1989 | 2 | |
| 15 | 1993 | 1 | |
| 16 | 1993 | 1 | |
| 17 | 1991 | 1 | |
| 18 | 2001 | 0 |
About I. Babich
I. Babich is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics, having authored 18 papers that have together received 576 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (9 papers), Electron and X-Ray Spectroscopy Techniques (6 papers), Semiconductor materials and devices (4 papers), Block Copolymer Self-Assembly (3 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers), Anodic Oxide Films and Nanostructures (3 papers), Nanofabrication and Lithography Techniques (3 papers) and Surface and Thin Film Phenomena (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (61 citations), Electrical and Electronic Engineering (399 citations), Materials Chemistry (248 citations), Biomedical Engineering (175 citations) and Atomic and Molecular Physics, and Optics (99 citations). I. Babich has collaborated with scholars based in United States. Frequent co-authors include K.W. Guarini, E. Sikorski, Charles T. Black, Hansoo Kim, M. Ieong, Huiling Shang, Wilfried Haensch, P. Kozlowski, H.‐S. Philip Wong and C. D’Emic. Their work appears in journals such as Microelectronic Engineering, IEEE Electron Device Letters, IBM Journal of Research and Development, Journal of materials research/Pratt's guide to venture capital sources and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.