W. Höppner
Impact in
- Structural Biology top 1%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 4
- Advancements in Semiconductor Devices and Circuit Design 2
-
- Force Microscopy Techniques and Applications 2
- Semiconductor materials and interfaces 1
- Co-authors
- F.H. Baumann (2 shared papers)Peter Schwander (2 shared papers)W.D. Rau (2 shared papers)A. Ourmazd (2 shared papers)H. Rücker (3 shared papers)B. Heinemann (2 shared papers)D. Schmidt (2 shared papers)U. Haak (3 shared papers)
- Journals
- Microelectronic Engineering (3 papers)Journal of Applied Physics (1 paper)Physical Review Letters (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (1 paper)
In The Last Decade
W. Höppner
9 papers receiving 345 citations
Peers
Comparison fields: 5 of 35
- Structural Biology 201
- Surfaces, Coatings and Films 135
- Radiation 36
- Electrical and Electronic Engineering 216
- Atomic and Molecular Physics, and Optics 110
Countries citing papers authored by W. Höppner
This map shows the geographic impact of W. Höppner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W. Höppner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W. Höppner more than expected).
Fields of papers citing papers by W. Höppner
This network shows the impact of papers produced by W. Höppner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W. Höppner. The network helps show where W. Höppner may publish in the future.
Co-authors
The 25 scholars most cited alongside W. Höppner, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1999 | 283 | |
| 2 | 2004 | 34 | |
| 3 | 1996 | 16 | |
| 4 | 2002 | 7 | |
| 5 | 2005 | 5 | |
| 6 | 1996 | 4 | |
| 7 | 1991 | 3 | |
| 8 | 2012 | 3 | |
| 9 | 1996 | 1 |
About W. Höppner
W. Höppner is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Structural Biology, Surfaces, Coatings and Films and Biomedical Engineering, having authored 9 papers that have together received 356 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (4 papers), Advanced Electron Microscopy Techniques and Applications (2 papers), Force Microscopy Techniques and Applications (2 papers), Advancements in Semiconductor Devices and Circuit Design (2 papers), Metal and Thin Film Mechanics (1 paper), Nanowire Synthesis and Applications (1 paper), Surface Roughness and Optical Measurements (1 paper) and Semiconductor materials and interfaces (1 paper). The work is most often cited by research in Structural Biology (201 citations), Surfaces, Coatings and Films (135 citations), Radiation (36 citations), Electrical and Electronic Engineering (216 citations) and Atomic and Molecular Physics, and Optics (110 citations). W. Höppner has collaborated with scholars based in Germany and Russia. Frequent co-authors include F.H. Baumann, Peter Schwander, W.D. Rau, A. Ourmazd, H. Rücker, B. Heinemann, D. Schmidt, U. Haak, S. Marschmeyer and R. Barth. Their work appears in journals such as Microelectronic Engineering, Journal of Applied Physics, Physical Review Letters and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.