Thomas Basler
Impact in
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- Silicon Carbide Semiconductor Technologies
- Multilevel Inverters and Converters
- Advanced DC-DC Converters
- Electronic Packaging and Soldering Technologies
- HVDC Systems and Fault Protection
- Radiation Effects in Electronics
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- GaN-based semiconductor devices and materials
Papers in
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- Silicon Carbide Semiconductor Technologies 82
- Multilevel Inverters and Converters 3
- Semiconductor materials and devices 1
- Integrated Circuits and Semiconductor Failure Analysis 1
- Electronic Packaging and Soldering Technologies 1
- Advancements in Semiconductor Devices and Circuit Design 1
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- GaN-based semiconductor devices and materials 7
- Co-authors
- Josef Lutz (53 shared papers)Thomas Aichinger (6 shared papers)Dethard Peters (6 shared papers)Wolfgang Bergner (4 shared papers)Romain Esteve (4 shared papers)Ralf Siemieniec (3 shared papers)Roland Rupp (5 shared papers)Katja Puschkarsky (1 shared paper)
- Journals
- Microelectronics Reliability (14 papers)IEEE Transactions on Power Electronics (7 papers)IEEE Transactions on Electron Devices (3 papers)IEEE Transactions on Components Packaging and Manufacturing Technology (1 paper)Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena (3 papers)
In The Last Decade
Thomas Basler
79 papers receiving 884 citations
Peers
Comparison fields: 5 of 24
- Electrical and Electronic Engineering 869
- Condensed Matter Physics 22
- Control and Systems Engineering 19
- Safety, Risk, Reliability and Quality 6
- Automotive Engineering 4
Countries citing papers authored by Thomas Basler
This map shows the geographic impact of Thomas Basler's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thomas Basler with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thomas Basler more than expected).
Fields of papers citing papers by Thomas Basler
This network shows the impact of papers produced by Thomas Basler. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thomas Basler. The network helps show where Thomas Basler may publish in the future.
Co-authors
The 25 scholars most cited alongside Thomas Basler, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 89 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2017 | 124 | |
| 2 | 2018 | 81 | |
| 3 | 2012 | 65 | |
| 4 | 2017 | 65 | |
| 5 | 2012 | 41 | |
| 6 | 2021 | 39 | |
| 7 | 2024 | 36 | |
| 8 | 2016 | 27 | |
| 9 | 2023 | 26 | |
| 10 | The New CoolSiC™ Trench MOSFET Technology for Low Gate Oxide Stress and High Performance | 2017 | 24 |
| 11 | 2018 | 23 | |
| 12 | 2013 | 21 | |
| 13 | 2017 | 21 | |
| 14 | Electro - Thermal Simulations and Experimental Results on the Surge Current Capability of 1200 V SiC MPS Diodes | 2014 | 18 |
| 15 | Practical Aspects and Body Diode Robustness of a 1200 V SiC Trench MOSFET | 2018 | 18 |
| 16 | 2019 | 16 | |
| 17 | 2021 | 15 | |
| 18 | 2023 | 15 | |
| 19 | The influence of asymmetries on the parallel connection of IGBT chips under short-circuit condition | 2011 | 13 |
| 20 | 2015 | 12 |
About Thomas Basler
Thomas Basler is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics, Automotive Engineering, Safety, Risk, Reliability and Quality and Nuclear Energy and Engineering, having authored 89 papers that have together received 904 indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (82 papers), GaN-based semiconductor devices and materials (7 papers), Multilevel Inverters and Converters (3 papers), Semiconductor materials and devices (1 paper), Integrated Circuits and Semiconductor Failure Analysis (1 paper), Electronic Packaging and Soldering Technologies (1 paper), Reliability and Maintenance Optimization (1 paper) and Advancements in Semiconductor Devices and Circuit Design (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (869 citations), Condensed Matter Physics (22 citations), Control and Systems Engineering (19 citations), Safety, Risk, Reliability and Quality (6 citations) and Automotive Engineering (4 citations). Thomas Basler has collaborated with scholars based in Germany, China and Austria. Frequent co-authors include Josef Lutz, Thomas Aichinger, Dethard Peters, Wolfgang Bergner, Romain Esteve, Ralf Siemieniec, Roland Rupp, Katja Puschkarsky, H. Reisinger and Gerald Rescher. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Power Electronics, IEEE Transactions on Electron Devices, IEEE Transactions on Components Packaging and Manufacturing Technology and Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.