S. Baudot
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Silicon Carbide Semiconductor Technologies
Papers in
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- Semiconductor materials and devices 19
- Advancements in Semiconductor Devices and Circuit Design 17
- Integrated Circuits and Semiconductor Failure Analysis 11
- Ferroelectric and Negative Capacitance Devices 6
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- Electronic and Structural Properties of Oxides 3
- Co-authors
- F. Andrieu (6 shared papers)J. Eymery (4 shared papers)F. Rieutord (1 shared paper)G. Reimbold (4 shared papers)E. Martínez (4 shared papers)F. Martín (4 shared papers)T. Schram (3 shared papers)V. Loup (2 shared papers)
- Journals
- Journal of Applied Physics (3 papers)Microelectronic Engineering (3 papers)IEEE Transactions on Device and Materials Reliability (1 paper)Applied Surface Science (1 paper)Applied Physics Letters (1 paper)
- Partner nations
- FranceBelgiumUnited States
In The Last Decade
S. Baudot
25 papers receiving 169 citations
Peers
Comparison fields: 5 of 23
- Structural Biology 8
- Electrical and Electronic Engineering 147
- Surfaces, Coatings and Films 13
- Atomic and Molecular Physics, and Optics 37
- Biomedical Engineering 43
Countries citing papers authored by S. Baudot
This map shows the geographic impact of S. Baudot's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Baudot with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Baudot more than expected).
Fields of papers citing papers by S. Baudot
This network shows the impact of papers produced by S. Baudot. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Baudot. The network helps show where S. Baudot may publish in the future.
Co-authors
The 25 scholars most cited alongside S. Baudot, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 25 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2009 | 23 | |
| 2 | 2012 | 20 | |
| 3 | 2019 | 19 | |
| 4 | 2020 | 14 | |
| 5 | 2013 | 13 | |
| 6 | 2012 | 12 | |
| 7 | 2013 | 10 | |
| 8 | 2018 | 8 | |
| 9 | 2018 | 7 | |
| 10 | 2015 | 7 | |
| 11 | 2011 | 6 | |
| 12 | 2009 | 5 | |
| 13 | 2020 | 5 | |
| 14 | 2018 | 4 | |
| 15 | 2009 | 3 | |
| 16 | 2010 | 3 | |
| 17 | 2009 | 3 | |
| 18 | 2021 | 2 | |
| 19 | 2010 | 2 | |
| 20 | 2013 | 2 |
About S. Baudot
S. Baudot is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics, Biomedical Engineering and Structural Biology, having authored 25 papers that have together received 173 indexed citations. Recurring topics across this work include Semiconductor materials and devices (19 papers), Advancements in Semiconductor Devices and Circuit Design (17 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Ferroelectric and Negative Capacitance Devices (6 papers), Electronic and Structural Properties of Oxides (3 papers), Semiconductor materials and interfaces (2 papers), Advanced Materials Characterization Techniques (1 paper) and Advanced X-ray Imaging Techniques (1 paper). The work is most often cited by research in Structural Biology (8 citations), Electrical and Electronic Engineering (147 citations), Surfaces, Coatings and Films (13 citations), Atomic and Molecular Physics, and Optics (37 citations) and Biomedical Engineering (43 citations). S. Baudot has collaborated with scholars based in France, Belgium and United States. Frequent co-authors include F. Andrieu, J. Eymery, F. Rieutord, G. Reimbold, E. Martínez, F. Martín, T. Schram, V. Loup, Blanka Detlefs and M. Gros‐Jean. Their work appears in journals such as Journal of Applied Physics, Microelectronic Engineering, IEEE Transactions on Device and Materials Reliability, Applied Surface Science and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.