Robert S. Johnson
Impact in
-
- Semiconductor materials and devices
- Radiation Effects in Electronics
- Silicon and Solar Cell Technologies
- Silicon Carbide Semiconductor Technologies
- Advancements in Semiconductor Devices and Circuit Design
Papers in
-
- Semiconductor materials and devices 15
- Radiation Effects in Electronics 2
- Silicon Carbide Semiconductor Technologies 1
-
- Nonlinear Optical Materials Research 1
- Co-authors
- Gerald Lucovsky (16 shared papers)Christopher L. Hinkle (2 shared papers)H. Niimi (1 shared paper)G. B. Rayner (2 shared papers)Veena Misra (1 shared paper)Harald W. Ade (1 shared paper)Dale E. Sayers (1 shared paper)Kenneth F. Galloway (2 shared papers)
- Journals
- Applied Physics Letters (2 papers)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (2 papers)Applied Surface Science (1 paper)Microelectronic Engineering (1 paper)Microelectronics Reliability (1 paper)
- Partner nations
- United StatesBrazil
In The Last Decade
Robert S. Johnson
17 papers receiving 508 citations
Peers
Comparison fields: 5 of 19
- Electrical and Electronic Engineering 476
- Surfaces, Coatings and Films 12
- Radiation 11
- Condensed Matter Physics 13
- Electronic, Optical and Magnetic Materials 17
Countries citing papers authored by Robert S. Johnson
This map shows the geographic impact of Robert S. Johnson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Robert S. Johnson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Robert S. Johnson more than expected).
Fields of papers citing papers by Robert S. Johnson
This network shows the impact of papers produced by Robert S. Johnson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Robert S. Johnson. The network helps show where Robert S. Johnson may publish in the future.
Co-authors
The 25 scholars most cited alongside Robert S. Johnson, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2001 | 169 | |
| 2 | 2001 | 69 | |
| 3 | 2001 | 63 | |
| 4 | 2002 | 40 | |
| 5 | 2000 | 39 | |
| 6 | 2001 | 35 | |
| 7 | 2001 | 31 | |
| 8 | 2002 | 17 | |
| 9 | 2001 | 13 | |
| 10 | 2002 | 13 | |
| 11 | 2002 | 11 | |
| 12 | 1999 | 8 | |
| 13 | 1996 | 6 | |
| 14 | 2001 | 6 | |
| 15 | 2002 | 5 | |
| 16 | Properties of aluminum oxide and aluminum oxide alloys and their interfaces with silicon and silicon dioxide | 2002 | 1 |
| 17 | 2002 | 1 |
About Robert S. Johnson
Robert S. Johnson is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Materials Chemistry and Nuclear Energy and Engineering, having authored 17 papers that have together received 527 indexed citations. Recurring topics across this work include Semiconductor materials and devices (15 papers), Radiation Effects in Electronics (2 papers), Silicon Nanostructures and Photoluminescence (1 paper), Photorefractive and Nonlinear Optics (1 paper), Silicon Carbide Semiconductor Technologies (1 paper) and Nonlinear Optical Materials Research (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (476 citations), Surfaces, Coatings and Films (12 citations), Radiation (11 citations), Condensed Matter Physics (13 citations) and Electronic, Optical and Magnetic Materials (17 citations). Robert S. Johnson has collaborated with scholars based in United States and Brazil. Frequent co-authors include Gerald Lucovsky, Christopher L. Hinkle, H. Niimi, G. B. Rayner, Veena Misra, Harald W. Ade, Dale E. Sayers, Kenneth F. Galloway, Marty R. Shaneyfelt and T.L. Meisenheimer. Their work appears in journals such as Applied Physics Letters, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Applied Surface Science, Microelectronic Engineering and Microelectronics Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.