R.L. Pease
Impact in
-
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Memory and Neural Computing
- Electrostatic Discharge in Electronics
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
Papers in
-
- Radiation Effects in Electronics 93
- Semiconductor materials and devices 91
- Advancements in Semiconductor Devices and Circuit Design 47
- Integrated Circuits and Semiconductor Failure Analysis 39
- Advanced Memory and Neural Computing 13
- Electrostatic Discharge in Electronics 9
- Silicon and Solar Cell Technologies 9
-
- VLSI and Analog Circuit Testing 8
- Co-authors
- Ronald D. Schrimpf (40 shared papers)Daniel M. Fleetwood (36 shared papers)W.E. Combs (16 shared papers)R.N. Nowlin (7 shared papers)Hugh Barnaby (23 shared papers)S. McClure (13 shared papers)K.F. Galloway (16 shared papers)M. DeLaus (7 shared papers)
- Journals
- IEEE Transactions on Nuclear Science (89 papers)IEEE Transactions on Electron Devices (3 papers)Microelectronics Reliability (2 papers)Nuclear Science and Engineering (1 paper)IEEE Transactions on Semiconductor Manufacturing (1 paper)
- Partner nations
- United StatesFranceGermany
In The Last Decade
R.L. Pease
120 papers receiving 4.1k citations
Peers
Comparison fields: 5 of 57
- Electrical and Electronic Engineering 4.3k
- Hardware and Architecture 340
- Radiation 223
- Automotive Engineering 144
- Safety, Risk, Reliability and Quality 70
Countries citing papers authored by R.L. Pease
This map shows the geographic impact of R.L. Pease's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R.L. Pease with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R.L. Pease more than expected).
Fields of papers citing papers by R.L. Pease
This network shows the impact of papers produced by R.L. Pease. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R.L. Pease. The network helps show where R.L. Pease may publish in the future.
Co-authors
The 25 scholars most cited alongside R.L. Pease, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 124 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1991 | 264 | |
| 2 | 1994 | 240 | |
| 3 | 1993 | 171 | |
| 4 | 2009 | 129 | |
| 5 | 1997 | 114 | |
| 6 | 1994 | 104 | |
| 7 | 2003 | 102 | |
| 8 | 1995 | 101 | |
| 9 | 1995 | 95 | |
| 10 | 2003 | 93 | |
| 11 | 1996 | 90 | |
| 12 | 1993 | 87 | |
| 13 | 1998 | 80 | |
| 14 | 1989 | 77 | |
| 15 | 1995 | 77 | |
| 16 | 2002 | 76 | |
| 17 | 2007 | 74 | |
| 18 | 1994 | 73 | |
| 19 | 2000 | 73 | |
| 20 | 2004 | 72 |
About R.L. Pease
R.L. Pease is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Radiation, Automotive Engineering and Materials Chemistry, having authored 124 papers that have together received 4.4k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (93 papers), Semiconductor materials and devices (91 papers), Advancements in Semiconductor Devices and Circuit Design (47 papers), Integrated Circuits and Semiconductor Failure Analysis (39 papers), Advanced Memory and Neural Computing (13 papers), Electrostatic Discharge in Electronics (9 papers), Silicon and Solar Cell Technologies (9 papers) and VLSI and Analog Circuit Testing (8 papers). The work is most often cited by research in Electrical and Electronic Engineering (4.3k citations), Hardware and Architecture (340 citations), Radiation (223 citations), Automotive Engineering (144 citations) and Safety, Risk, Reliability and Quality (70 citations). R.L. Pease has collaborated with scholars based in United States, France and Germany. Frequent co-authors include Ronald D. Schrimpf, Daniel M. Fleetwood, W.E. Combs, R.N. Nowlin, Hugh Barnaby, S. McClure, K.F. Galloway, M. DeLaus, S.L. Kosier and S.C. Witczak. Their work appears in journals such as IEEE Transactions on Nuclear Science, IEEE Transactions on Electron Devices, Microelectronics Reliability, Nuclear Science and Engineering and IEEE Transactions on Semiconductor Manufacturing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.