L.C. Riewe

1.8k citations
24 papers · 1.5k · 1 hit paper · h-index 17

Impact in

    • Semiconductor materials and devices
    • Advancements in Semiconductor Devices and Circuit Design
    • Radiation Effects in Electronics
    • Integrated Circuits and Semiconductor Failure Analysis
    • Advanced Memory and Neural Computing
    • Silicon Carbide Semiconductor Technologies

Papers in

    • Semiconductor materials and devices 22
    • Advancements in Semiconductor Devices and Circuit Design 17
    • Radiation Effects in Electronics 14
    • Integrated Circuits and Semiconductor Failure Analysis 12
    • CCD and CMOS Imaging Sensors 1
    • Silicon Carbide Semiconductor Technologies 1
    • VLSI and Analog Circuit Testing 1

L.C. Riewe

24 papers receiving 1.4k citations

L.C. Riewe's Hit Papers

Effects of oxide traps, interface traps, and ‘‘border traps’’ on metal-oxide-semiconductor devices 1993 · 416 citations
4160+11+22Years since publication100200300400

Peers

L.C. Riewe
Comparison fields: 5 of 39
  • Electrical and Electronic Engineering 1.5k
  • Hardware and Architecture 59
  • Radiation 35
  • Materials Chemistry 175
  • Atomic and Molecular Physics, and Optics 93
Replace R.A. Reber with:
R.A. Reber United States
A. Murthy United States
K.P. MacWilliams United States
K. Ohyu Japan
T. Kaga Japan
M Armstrong United States
Valeriya Kilchytska Belgium
J. Aitken United States
Akio Shima Japan
A.J. Auberton‐Hervé France
L.C. Riewe relative to R.A. Reber United States R.A. Reber's profile →
Citations per field
00.5×1.5×2.1×
R.A. Reber · 1×
Citations per year

Countries citing papers authored by L.C. Riewe

Since Specialization
Citations

This map shows the geographic impact of L.C. Riewe's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L.C. Riewe with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L.C. Riewe more than expected).

Fields of papers citing papers by L.C. Riewe

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by L.C. Riewe. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L.C. Riewe. The network helps show where L.C. Riewe may publish in the future.

Co-authors

The 25 scholars most cited alongside L.C. Riewe, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with L.C. Riewe Line = papers co-authored together L.C. Riewe links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 24 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Effects of oxide traps, interface traps, and ‘‘border traps’’ on metal-oxide-semiconductor devices
Hit paper breakdown →
1993416
2 1996151
3 1995110
4 199281
5 198977
6 199374
7 200073
8 199172
9 200270
10 198869
11 199063
12 200055
13 199846
14 199839
15 199929
16 200321
17 199918
18 199111
19 20018
20 20007

About L.C. Riewe

L.C. Riewe is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Materials Chemistry, Infectious Diseases and Organic Chemistry, having authored 24 papers that have together received 1.5k indexed citations. Recurring topics across this work include Semiconductor materials and devices (22 papers), Advancements in Semiconductor Devices and Circuit Design (17 papers), Radiation Effects in Electronics (14 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers), CCD and CMOS Imaging Sensors (1 paper), Silicon Carbide Semiconductor Technologies (1 paper), VLSI and Analog Circuit Testing (1 paper) and Electronic and Structural Properties of Oxides (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (1.5k citations), Hardware and Architecture (59 citations), Radiation (35 citations), Materials Chemistry (175 citations) and Atomic and Molecular Physics, and Optics (93 citations). L.C. Riewe has collaborated with scholars based in United States and France. Frequent co-authors include Daniel M. Fleetwood, P.S. Winokur, M.R. Shaneyfelt, J.R. Schwank, R.A. Reber, T.L. Meisenheimer, S.C. Witczak, R.L. Pease, Ronald D. Schrimpf and W. L. Warren. Their work appears in journals such as IEEE Transactions on Nuclear Science, Journal of Applied Physics, Microelectronics Reliability, University of North Texas Digital Library (University of North Texas) and OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information).

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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