Michael Current

1.8k citations
125 papers · 1.4k · h-index 20

Impact in

Papers in

    • Integrated Circuits and Semiconductor Failure Analysis 76
    • Semiconductor materials and devices 61
    • Silicon and Solar Cell Technologies 53
    • Advancements in Semiconductor Devices and Circuit Design 15
    • Ion-surface interactions and analysis 33

Michael Current

108 papers receiving 1.3k citations

Peers

Michael Current
Comparison fields: 5 of 75
  • Computational Mechanics 417
  • Electrical and Electronic Engineering 990
  • Materials Chemistry 426
  • Atomic and Molecular Physics, and Optics 279
  • Mechanics of Materials 179
Replace J. Perrière with:
J. Perrière France
N. Tomozeiu Netherlands
J. Nord Finland
A. Cröll Germany
Narumi Inoue Japan
R. B. Gregory United States
John J. Adams United States
I. Golecki United States
W. Miles Clift United States
H. Garem France
Michael Current relative to J. Perrière France J. Perrière's profile →
Citations per field
00.5×
J. Perrière · 1×
Citations per year

Countries citing papers authored by Michael Current

Since Specialization
Citations

This map shows the geographic impact of Michael Current's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Michael Current with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Michael Current more than expected).

Fields of papers citing papers by Michael Current

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Michael Current. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Michael Current. The network helps show where Michael Current may publish in the future.

Co-authors

The 25 scholars most cited alongside Michael Current, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Michael Current Line = papers co-authored together Michael Current links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 125 papers — load more, or switch the sort, to bring in the rest.

#Work
1 1997231
2 201457
3 198351
4 199149
5 197648
6 198147
7 201143
8 201437
9 199137
10 201636
11 198131
12 199130
13 198527
14 199327
15 200626
16 199422
17 199122
18 198122
19 200620
20 198319

About Michael Current

Michael Current is a scholar working on Electrical and Electronic Engineering, Computational Mechanics, Atomic and Molecular Physics, and Optics, Materials Chemistry and Mechanics of Materials, having authored 125 papers that have together received 1.4k indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (76 papers), Semiconductor materials and devices (61 papers), Silicon and Solar Cell Technologies (53 papers), Ion-surface interactions and analysis (33 papers), Semiconductor materials and interfaces (24 papers), Advancements in Semiconductor Devices and Circuit Design (15 papers), Metal and Thin Film Mechanics (10 papers) and Electron and X-Ray Spectroscopy Techniques (8 papers). The work is most often cited by research in Computational Mechanics (417 citations), Electrical and Electronic Engineering (990 citations), Materials Chemistry (426 citations), Atomic and Molecular Physics, and Optics (279 citations) and Mechanics of Materials (179 citations). Michael Current has collaborated with scholars based in United States, Japan and Taiwan. Frequent co-authors include David N. Seidman, Ching-Yeu Wei, N.W. Cheung, M. A. Lieberman, C. W. Magee, John Borland, D. J. Eaglesham, O. W. Holland, J. W. Mayer and J. Melngailis. Their work appears in journals such as Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Applied Physics Letters, Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties and IEEE Transactions on Electron Devices.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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