Jérôme Boch
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
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- Radiation Effects in Electronics
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Electrostatic Discharge in Electronics
- Advanced Memory and Neural Computing
Papers in
-
- Radiation Effects in Electronics 99
- Semiconductor materials and devices 52
- Integrated Circuits and Semiconductor Failure Analysis 46
- Electrostatic Discharge in Electronics 26
- Advancements in Semiconductor Devices and Circuit Design 22
-
- VLSI and Analog Circuit Testing 22
- Co-authors
- Frédéric Saigné (84 shared papers)L. Dusseau (52 shared papers)Ronald Schrimpf (25 shared papers)F. Wrobel (20 shared papers)Antoine D. Touboul (21 shared papers)J.-R. Vaillé (20 shared papers)B. Sagnes (13 shared papers)A. Michez (21 shared papers)
- Journals
- IEEE Transactions on Nuclear Science (66 papers)Microelectronics Reliability (4 papers)Electronics (3 papers)Applied Physics Letters (3 papers)Journal of Instrumentation (2 papers)
- Partner nations
- FranceUnited StatesSwitzerland
In The Last Decade
Jérôme Boch
111 papers receiving 1.2k citations
Peers
Comparison fields: 5 of 45
- Hardware and Architecture 187
- Electrical and Electronic Engineering 1.2k
- Radiation 98
- Nuclear and High Energy Physics 77
- Automotive Engineering 56
Countries citing papers authored by Jérôme Boch
This map shows the geographic impact of Jérôme Boch's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jérôme Boch with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jérôme Boch more than expected).
Fields of papers citing papers by Jérôme Boch
This network shows the impact of papers produced by Jérôme Boch. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jérôme Boch. The network helps show where Jérôme Boch may publish in the future.
Co-authors
The 25 scholars most cited alongside Jérôme Boch, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 124 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2005 | 64 | |
| 2 | 2006 | 61 | |
| 3 | 2006 | 49 | |
| 4 | 2005 | 39 | |
| 5 | 2009 | 38 | |
| 6 | 2004 | 34 | |
| 7 | 2007 | 31 | |
| 8 | 2007 | 31 | |
| 9 | 2006 | 30 | |
| 10 | 2009 | 30 | |
| 11 | 2007 | 28 | |
| 12 | 2019 | 27 | |
| 13 | 2010 | 27 | |
| 14 | 2006 | 26 | |
| 15 | 2020 | 26 | |
| 16 | 2005 | 26 | |
| 17 | 2003 | 26 | |
| 18 | 2013 | 26 | |
| 19 | 2015 | 23 | |
| 20 | 2009 | 23 |
About Jérôme Boch
Jérôme Boch is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Radiation, Nuclear and High Energy Physics and Aerospace Engineering, having authored 124 papers that have together received 1.3k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (99 papers), Semiconductor materials and devices (52 papers), Integrated Circuits and Semiconductor Failure Analysis (46 papers), Electrostatic Discharge in Electronics (26 papers), Advancements in Semiconductor Devices and Circuit Design (22 papers), VLSI and Analog Circuit Testing (22 papers), Radiation Detection and Scintillator Technologies (10 papers) and Particle Detector Development and Performance (6 papers). The work is most often cited by research in Hardware and Architecture (187 citations), Electrical and Electronic Engineering (1.2k citations), Radiation (98 citations), Nuclear and High Energy Physics (77 citations) and Automotive Engineering (56 citations). Jérôme Boch has collaborated with scholars based in France, United States and Switzerland. Frequent co-authors include Frédéric Saigné, L. Dusseau, Ronald Schrimpf, F. Wrobel, Antoine D. Touboul, J.-R. Vaillé, B. Sagnes, A. Michez, E. Lorfèvre and Gilles Gasiot. Their work appears in journals such as IEEE Transactions on Nuclear Science, Microelectronics Reliability, Electronics, Applied Physics Letters and Journal of Instrumentation.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.