Gerald L. Hash

2.1k citations

49 papers · 1.7k · h-index 25

Impact in

Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
Electrical and Electronic Engineering top 2%
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Advanced Memory and Neural Computing
- Low-power high-performance VLSI design

Papers in

Electrical and Electronic Engineering 48
- Radiation Effects in Electronics 35
- Semiconductor materials and devices 34
- Integrated Circuits and Semiconductor Failure Analysis 27
- Advancements in Semiconductor Devices and Circuit Design 13
- Electrostatic Discharge in Electronics 6
- Advanced Memory and Neural Computing 5
Hardware and Architecture 8
- VLSI and Analog Circuit Testing 8

Co-authors: Marty R. Shaneyfelt (34 shared papers)P.E. Dodd (22 shared papers)Fred W. Sexton (19 shared papers)J.R. Schwank (20 shared papers)Peter S. Winokur (14 shared papers)Daniel M Fleetwood (7 shared papers)Bruce L. Draper (5 shared papers)David S. Walsh (4 shared papers)
Journals: IEEE Transactions on Nuclear Science (33 papers)NASA STI Repository (National Aeronautics and Space Administration) (1 paper)OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) (2 papers)University of North Texas Digital Library (University of North Texas) (4 papers)ESASP (1 paper)
Partner nations: United States France Canada

In The Last Decade

Gerald L. Hash

46 papers receiving 1.6k citations

Peers

Countries citing papers authored by Gerald L. Hash

Since Specialization

Citations

This map shows the geographic impact of Gerald L. Hash's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Gerald L. Hash with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Gerald L. Hash more than expected).

Fields of papers citing papers by Gerald L. Hash

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Gerald L. Hash. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Gerald L. Hash. The network helps show where Gerald L. Hash may publish in the future.

Co-authors

The 25 scholars most cited alongside Gerald L. Hash, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Gerald L. Hash Line = papers co-authored together Gerald L. Hash links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 49 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	SEU-sensitive volumes in bulk and SOI SRAMs from first-principles calculations and experiments IEEE Transactions on Nuclear Science ·P.E. Dodd, A.R. Shaneyfelt, Kevin M. Horn, David S. Walsh, Gerald L. Hash, T.A. Hill, Bruce L. Draper, J.R. Schwank	2001	164
2	Precursor ion damage and angular dependence of single event gate rupture in thin oxides IEEE Transactions on Nuclear Science ·Fred W. Sexton, Daniel M Fleetwood, Marty R. Shaneyfelt, P.E. Dodd, Gerald L. Hash, L.P. Schanwald, R.A. Loemker, K.S. Krisch	1998	115
3	Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits IEEE Transactions on Nuclear Science ·P.E. Dodd, J.R. Schwank, Marty R. Shaneyfelt, J. Félix, Philippe Paillet, V. Ferlet-Cavrois, Jacques Baggio, Robert A. Reed	2007	103
4	Impact of technology trends on SEU in CMOS SRAMs IEEE Transactions on Nuclear Science ·P.E. Dodd, Fred W. Sexton, Gerald L. Hash, Marty R. Shaneyfelt, Bruce L. Draper, A.J. Farino, Richard S. Flores	1996	98
5	Single event gate rupture in thin gate oxides IEEE Transactions on Nuclear Science ·Fred W. Sexton, Daniel M Fleetwood, Marty R. Shaneyfelt, P.E. Dodd, Gerald L. Hash	1997	97
6	Effects of particle energy on proton-induced single-event latchup IEEE Transactions on Nuclear Science ·J.R. Schwank, Marty R. Shaneyfelt, Jacques Baggio, P.E. Dodd, J. Félix, V. Ferlet-Cavrois, Philippe Paillet, Damien J. H. Lambert	2005	92
7	Impact of ion energy on single-event upset IEEE Transactions on Nuclear Science ·P.E. Dodd, O. Musseau, Marty R. Shaneyfelt, Fred W. Sexton, Claudine D'hose, Gerald L. Hash, Martial Martinez, R.A. Loemker	1998	81
8	Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation IEEE Transactions on Nuclear Science ·R.L. Pease, Andrew L. Sternberg, Younes Boulghassoul, Lloyd W. Massengill, Stephen P Buchner, Dale McMorrow, David S. Walsh, Gerald L. Hash	2002	76
9	Thermal-stress effects and enhanced low dose rate sensitivity in linear bipolar ICs IEEE Transactions on Nuclear Science ·Marty R. Shaneyfelt, J.R. Schwank, Steven C. Witczak, Daniel M Fleetwood, Ronald L. Pease, Peter S. Winokur, L.C. Riewe, Gerald L. Hash	2000	74
10	Impact of passivation layers on enhanced low-dose-rate sensitivity and pre-irradiation elevated-temperature stress effects in bipolar linear ICs IEEE Transactions on Nuclear Science ·Marty R. Shaneyfelt, Ronald L. Pease, J.R. Schwank, M.C. Maher, Gerald L. Hash, Daniel M Fleetwood, P.E. Dodd, C.A. Reber	2002	71
11	Total-Dose Failure Mechanisms of Integrated Circuits in Laboratory and Space Environments IEEE Transactions on Nuclear Science ·Peter S. Winokur, Fred W. Sexton, Gerald L. Hash, D. C. Turpin	1987	62
12	Neutron-induced soft errors, latchup, and comparison of SER test methods for SRAM technologies P.E. Dodd, Marty R. Shaneyfelt, J.R. Schwank, Gerald L. Hash	2003	58
13	Effects of Total Dose Irradiation on Single-Event Upset Hardness IEEE Transactions on Nuclear Science ·J.R. Schwank, Marty R. Shaneyfelt, J. Félix, P.E. Dodd, Jacques Baggio, V. Ferlet-Cavrois, Philippe Paillet, Gerald L. Hash	2006	54
14	Current Induced Avalanche in Epitaxial Structures IEEE Transactions on Nuclear Science ·Theodore F. Wrobel, Floyd N. Coppage, Gerald L. Hash, Linda J. Smith	1985	52
15	Single-event upset and snapback in silicon-on-insulator devices and integrated circuits IEEE Transactions on Nuclear Science ·P.E. Dodd, Marty R. Shaneyfelt, David S. Walsh, J.R. Schwank, Gerald L. Hash, R.A. Loemker, Bruce L. Draper, Peter S. Winokur	2000	47
16	Interface-trap building rates in wet and dry oxides IEEE Transactions on Nuclear Science ·Marty R. Shaneyfelt, J.R. Schwank, Daniel M Fleetwood, Peter S. Winokur, K.L. Hughes, Gerald L. Hash, M.P. Connors	1992	45
17	Neutron-induced latchup in SRAMs at ground level P.E. Dodd, Marty R. Shaneyfelt, J.R. Schwank, Gerald L. Hash	2003	44
18	Charge collection in SOI capacitors and circuits and its effect on SEU hardness IEEE Transactions on Nuclear Science ·J.R. Schwank, P.E. Dodd, Marty R. Shaneyfelt, György Vízkelethy, Bruce L. Draper, T.A. Hill, David S. Walsh, Gerald L. Hash	2002	44
19	Issues for single-event proton testing of SRAMs IEEE Transactions on Nuclear Science ·J.R. Schwank, P.E. Dodd, Marty R. Shaneyfelt, J.A. Feli, Gerald L. Hash, V. Ferlet-Cavrois, Philippe Paillet, Jacques Baggio	2004	39
20	Use of COTS microelectronics in radiation environments IEEE Transactions on Nuclear Science ·Peter S. Winokur, Gary K. Lum, Marty R. Shaneyfelt, Fred W. Sexton, Gerald L. Hash, Larry Scott	1999	37

About Gerald L. Hash

Gerald L. Hash is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Safety, Risk, Reliability and Quality, Radiation and Atomic and Molecular Physics, and Optics, having authored 49 papers that have together received 1.7k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (35 papers), Semiconductor materials and devices (34 papers), Integrated Circuits and Semiconductor Failure Analysis (27 papers), Advancements in Semiconductor Devices and Circuit Design (13 papers), VLSI and Analog Circuit Testing (8 papers), Electrostatic Discharge in Electronics (6 papers), Advanced Memory and Neural Computing (5 papers) and Reliability and Maintenance Optimization (3 papers). The work is most often cited by research in Hardware and Architecture (372 citations), Electrical and Electronic Engineering (1.7k citations), Radiation (143 citations), Nuclear and High Energy Physics (93 citations) and Nuclear Energy and Engineering (3 citations). Gerald L. Hash has collaborated with scholars based in United States, France and Canada. Frequent co-authors include Marty R. Shaneyfelt, P.E. Dodd, Fred W. Sexton, J.R. Schwank, Peter S. Winokur, Daniel M Fleetwood, Bruce L. Draper, David S. Walsh, Philippe Paillet and Jacques Baggio. Their work appears in journals such as IEEE Transactions on Nuclear Science, NASA STI Repository (National Aeronautics and Space Administration), OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information), University of North Texas Digital Library (University of North Texas) and ESASP.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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