F. Miller
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
-
- Radiation Effects in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Silicon Carbide Semiconductor Technologies
- Electrostatic Discharge in Electronics
Papers in
-
- Radiation Effects in Electronics 32
- Integrated Circuits and Semiconductor Failure Analysis 23
- Semiconductor materials and devices 16
- Electrostatic Discharge in Electronics 4
-
- VLSI and Analog Circuit Testing 6
- Co-authors
- N. Buard (22 shared papers)Stephen P Buchner (3 shared papers)Vincent Pouget (3 shared papers)Dale McMorrow (3 shared papers)Rémi Gaillard (15 shared papers)T. Carrière (10 shared papers)Bruno Allard (3 shared papers)Marise Bafleur (4 shared papers)
- Journals
- IEEE Transactions on Nuclear Science (24 papers)Microelectronics Reliability (3 papers)The European Physical Journal C (1 paper)Journal of Applied Physics (1 paper)Instruments (1 paper)
- Partner nations
- FranceUnited StatesNetherlands
In The Last Decade
F. Miller
49 papers receiving 734 citations
Peers
Comparison fields: 5 of 41
- Hardware and Architecture 179
- Electrical and Electronic Engineering 692
- Radiation 67
- Safety, Risk, Reliability and Quality 39
- Instrumentation 12
Countries citing papers authored by F. Miller
This map shows the geographic impact of F. Miller's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Miller with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Miller more than expected).
Fields of papers citing papers by F. Miller
This network shows the impact of papers produced by F. Miller. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Miller. The network helps show where F. Miller may publish in the future.
Co-authors
The 25 scholars most cited alongside F. Miller, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 50 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2013 | 137 | |
| 2 | 2010 | 59 | |
| 3 | 2006 | 45 | |
| 4 | 2014 | 45 | |
| 5 | 2013 | 45 | |
| 6 | 2012 | 44 | |
| 7 | 2004 | 40 | |
| 8 | 2018 | 36 | |
| 9 | 2008 | 34 | |
| 10 | 2006 | 26 | |
| 11 | 2006 | 24 | |
| 12 | 2013 | 19 | |
| 13 | 2008 | 17 | |
| 14 | 2010 | 13 | |
| 15 | Interest of laser test facility for the assessment of natural radiation environment effects on integrated circuits based systems | 2003 | 11 |
| 16 | 2011 | 10 | |
| 17 | 2017 | 10 | |
| 18 | 2009 | 10 | |
| 19 | 2011 | 9 | |
| 20 | 2011 | 9 |
About F. Miller
F. Miller is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Radiation, Safety, Risk, Reliability and Quality and Nuclear and High Energy Physics, having authored 50 papers that have together received 754 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (32 papers), Integrated Circuits and Semiconductor Failure Analysis (23 papers), Semiconductor materials and devices (16 papers), Radiation Detection and Scintillator Technologies (8 papers), VLSI and Analog Circuit Testing (6 papers), Ion-surface interactions and analysis (6 papers), Nuclear reactor physics and engineering (5 papers) and Electrostatic Discharge in Electronics (4 papers). The work is most often cited by research in Hardware and Architecture (179 citations), Electrical and Electronic Engineering (692 citations), Radiation (67 citations), Safety, Risk, Reliability and Quality (39 citations) and Instrumentation (12 citations). F. Miller has collaborated with scholars based in France, United States and Netherlands. Frequent co-authors include N. Buard, Stephen P Buchner, Vincent Pouget, Dale McMorrow, Rémi Gaillard, T. Carrière, Bruno Allard, Marise Bafleur, Gerard Sarrabayrouse and P. Fouillat. Their work appears in journals such as IEEE Transactions on Nuclear Science, Microelectronics Reliability, The European Physical Journal C, Journal of Applied Physics and Instruments.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.