Winfried Kaiser
Impact in
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques
- Optical Coatings and Gratings
- Radiation top 5%
- Advanced X-ray Imaging Techniques
Papers in
-
- Advancements in Photolithography Techniques 34
- Integrated Circuits and Semiconductor Failure Analysis 17
-
- Electron and X-Ray Spectroscopy Techniques 19
- Optical Coatings and Gratings 5
- Co-authors
- Jan van Schoot (17 shared papers)Jens Timo Neumann (10 shared papers)Bernhard Kneer (10 shared papers)Michael Totzeck (1 shared paper)Kars Troost (12 shared papers)Paul Gräupner (6 shared papers)Judon Stoeldraijer (11 shared papers)Peter Kuerz (10 shared papers)
- Journals
- Solid State Technology (1 paper)Journal of Micro/Nanolithography MEMS and MOEMS (1 paper)Nature Photonics (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (16 papers)Optik & Photonik (1 paper)
- Partner nations
- GermanyNetherlandsUnited States
In The Last Decade
Winfried Kaiser
37 papers receiving 620 citations
Peers
Comparison fields: 5 of 48
- Surfaces, Coatings and Films 279
- Radiation 106
- Electrical and Electronic Engineering 539
- Biomedical Engineering 242
- Structural Biology 7
Countries citing papers authored by Winfried Kaiser
This map shows the geographic impact of Winfried Kaiser's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Winfried Kaiser with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Winfried Kaiser more than expected).
Fields of papers citing papers by Winfried Kaiser
This network shows the impact of papers produced by Winfried Kaiser. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Winfried Kaiser. The network helps show where Winfried Kaiser may publish in the future.
Co-authors
The 25 scholars most cited alongside Winfried Kaiser, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 38 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2007 | 105 | |
| 2 | 2015 | 57 | |
| 3 | 2017 | 49 | |
| 4 | 2017 | 46 | |
| 5 | 2020 | 41 | |
| 6 | 2020 | 32 | |
| 7 | 2019 | 29 | |
| 8 | 2012 | 25 | |
| 9 | 2013 | 25 | |
| 10 | 2013 | 23 | |
| 11 | 2015 | 22 | |
| 12 | 2020 | 22 | |
| 13 | 2015 | 20 | |
| 14 | 2021 | 17 | |
| 15 | 2015 | 17 | |
| 16 | 2017 | 16 | |
| 17 | 2010 | 15 | |
| 18 | 2014 | 15 | |
| 19 | 1991 | 12 | |
| 20 | 2019 | 12 |
About Winfried Kaiser
Winfried Kaiser is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Radiation, Biomedical Engineering and Mechanical Engineering, having authored 38 papers that have together received 699 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (34 papers), Electron and X-Ray Spectroscopy Techniques (19 papers), Integrated Circuits and Semiconductor Failure Analysis (17 papers), Advanced X-ray Imaging Techniques (7 papers), Optical Coatings and Gratings (5 papers), Advanced Measurement and Metrology Techniques (4 papers), Optical measurement and interference techniques (2 papers) and Adaptive optics and wavefront sensing (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (279 citations), Radiation (106 citations), Electrical and Electronic Engineering (539 citations), Biomedical Engineering (242 citations) and Structural Biology (7 citations). Winfried Kaiser has collaborated with scholars based in Germany, Netherlands and United States. Frequent co-authors include Jan van Schoot, Jens Timo Neumann, Bernhard Kneer, Michael Totzeck, Kars Troost, Paul Gräupner, Judon Stoeldraijer, Peter Kuerz, Eelco van Setten and Jos Benschop. Their work appears in journals such as Solid State Technology, Journal of Micro/Nanolithography MEMS and MOEMS, Nature Photonics, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE and Optik & Photonik.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.