Andreas Frommhold
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Advancements in Photolithography Techniques 31
- Integrated Circuits and Semiconductor Failure Analysis 16
- Semiconductor materials and devices 5
-
- Electron and X-Ray Spectroscopy Techniques 18
- Co-authors
- Alex P. G. Robinson (20 shared papers)Yasin Ekinci (7 shared papers)Richard E. Palmer (13 shared papers)Roberto Fallica (4 shared papers)Jason K. Stowers (2 shared papers)Andrew Grenville (2 shared papers)Dongxu Yang (9 shared papers)Jedsada Manyam (4 shared papers)
- Journals
- Microelectronic Engineering (3 papers)Journal of Micro/Nanolithography MEMS and MOEMS (3 papers)Journal of Electroceramics (1 paper)Electrochimica Acta (1 paper)Japanese Journal of Applied Physics (1 paper)
- Partner nations
- United KingdomBelgiumNetherlands
In The Last Decade
Andreas Frommhold
41 papers receiving 324 citations
Peers
Comparison fields: 5 of 32
- Surfaces, Coatings and Films 129
- Structural Biology 12
- Electrical and Electronic Engineering 287
- Biomedical Engineering 118
- Industrial and Manufacturing Engineering 26
Countries citing papers authored by Andreas Frommhold
This map shows the geographic impact of Andreas Frommhold's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Andreas Frommhold with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Andreas Frommhold more than expected).
Fields of papers citing papers by Andreas Frommhold
This network shows the impact of papers produced by Andreas Frommhold. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Andreas Frommhold. The network helps show where Andreas Frommhold may publish in the future.
Co-authors
The 25 scholars most cited alongside Andreas Frommhold, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 41 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2016 | 63 | |
| 2 | 2016 | 26 | |
| 3 | 2013 | 25 | |
| 4 | 2012 | 16 | |
| 5 | 2018 | 15 | |
| 6 | 2017 | 15 | |
| 7 | 2020 | 12 | |
| 8 | 2014 | 11 | |
| 9 | 2022 | 10 | |
| 10 | 2012 | 10 | |
| 11 | 2013 | 10 | |
| 12 | 2016 | 8 | |
| 13 | 2021 | 8 | |
| 14 | 2015 | 8 | |
| 15 | 2011 | 7 | |
| 16 | 2013 | 7 | |
| 17 | 2012 | 7 | |
| 18 | 2015 | 6 | |
| 19 | 2012 | 6 | |
| 20 | 2016 | 6 |
About Andreas Frommhold
Andreas Frommhold is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Materials Chemistry, Biomedical Engineering and Industrial and Manufacturing Engineering, having authored 41 papers that have together received 334 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (31 papers), Electron and X-Ray Spectroscopy Techniques (18 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers), Diamond and Carbon-based Materials Research (6 papers), Graphene research and applications (5 papers), Semiconductor materials and devices (5 papers), Industrial Vision Systems and Defect Detection (5 papers) and Nanofabrication and Lithography Techniques (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (129 citations), Structural Biology (12 citations), Electrical and Electronic Engineering (287 citations), Biomedical Engineering (118 citations) and Industrial and Manufacturing Engineering (26 citations). Andreas Frommhold has collaborated with scholars based in United Kingdom, Belgium and Netherlands. Frequent co-authors include Alex P. G. Robinson, Yasin Ekinci, Richard E. Palmer, Roberto Fallica, Jason K. Stowers, Andrew Grenville, Dongxu Yang, Jedsada Manyam, E.J. Tarte and John R. Roth. Their work appears in journals such as Microelectronic Engineering, Journal of Micro/Nanolithography MEMS and MOEMS, Journal of Electroceramics, Electrochimica Acta and Japanese Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.