H. Puchner
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
-
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
- Advanced Memory and Neural Computing
- Electrostatic Discharge in Electronics
Papers in
-
- Semiconductor materials and devices 36
- Integrated Circuits and Semiconductor Failure Analysis 25
- Radiation Effects in Electronics 25
- Advancements in Semiconductor Devices and Circuit Design 17
- Advanced Memory and Neural Computing 5
- Silicon and Solar Cell Technologies 4
- Advancements in Photolithography Techniques 4
-
- VLSI and Analog Circuit Testing 12
- Co-authors
- Andrew J. Walker (2 shared papers)S. Selberherr (12 shared papers)Frédéric Saigné (9 shared papers)F. Wrobel (9 shared papers)Georgios Tsiligiannis (9 shared papers)Luigi Dilillo (9 shared papers)Alberto Bosio (4 shared papers)Christopher Frost (4 shared papers)
- Journals
- IEEE Transactions on Nuclear Science (11 papers)IEEE Transactions on Electron Devices (4 papers)Microelectronics Reliability (3 papers)Microelectronic Engineering (1 paper)IEEE Electron Device Letters (1 paper)
- Partner nations
- United StatesAustriaFrance
In The Last Decade
H. Puchner
49 papers receiving 592 citations
Peers
Comparison fields: 5 of 35
- Hardware and Architecture 226
- Electrical and Electronic Engineering 608
- Radiation 32
- Safety, Risk, Reliability and Quality 23
- Computer Networks and Communications 36
Countries citing papers authored by H. Puchner
This map shows the geographic impact of H. Puchner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. Puchner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. Puchner more than expected).
Fields of papers citing papers by H. Puchner
This network shows the impact of papers produced by H. Puchner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. Puchner. The network helps show where H. Puchner may publish in the future.
Co-authors
The 25 scholars most cited alongside H. Puchner, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 54 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2005 | 147 | |
| 2 | 2014 | 51 | |
| 3 | 2009 | 30 | |
| 4 | 2004 | 30 | |
| 5 | 2004 | 28 | |
| 6 | 2014 | 28 | |
| 7 | 2004 | 24 | |
| 8 | 2007 | 23 | |
| 9 | 2007 | 21 | |
| 10 | 2006 | 20 | |
| 11 | 2007 | 20 | |
| 12 | 2014 | 19 | |
| 13 | 1995 | 17 | |
| 14 | 2015 | 16 | |
| 15 | 2018 | 14 | |
| 16 | 2002 | 14 | |
| 17 | 2016 | 11 | |
| 18 | 2020 | 9 | |
| 19 | 2020 | 9 | |
| 20 | 2021 | 7 |
About H. Puchner
H. Puchner is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Atomic and Molecular Physics, and Optics, Biomedical Engineering and Computational Mechanics, having authored 54 papers that have together received 634 indexed citations. Recurring topics across this work include Semiconductor materials and devices (36 papers), Integrated Circuits and Semiconductor Failure Analysis (25 papers), Radiation Effects in Electronics (25 papers), Advancements in Semiconductor Devices and Circuit Design (17 papers), VLSI and Analog Circuit Testing (12 papers), Advanced Memory and Neural Computing (5 papers), Silicon and Solar Cell Technologies (4 papers) and Advancements in Photolithography Techniques (4 papers). The work is most often cited by research in Hardware and Architecture (226 citations), Electrical and Electronic Engineering (608 citations), Radiation (32 citations), Safety, Risk, Reliability and Quality (23 citations) and Computer Networks and Communications (36 citations). H. Puchner has collaborated with scholars based in United States, Austria and France. Frequent co-authors include Andrew J. Walker, S. Selberherr, Frédéric Saigné, F. Wrobel, Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Christopher Frost, A. Virazel and A. Virtanen. Their work appears in journals such as IEEE Transactions on Nuclear Science, IEEE Transactions on Electron Devices, Microelectronics Reliability, Microelectronic Engineering and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.