C.-Y. Li

627 citations
44 papers · 487 · h-index 14

Impact in

Papers in

C.-Y. Li

43 papers receiving 459 citations

Peers

C.-Y. Li
Comparison fields: 5 of 31
  • Electronic, Optical and Magnetic Materials 198
  • Electrical and Electronic Engineering 401
  • Mechanical Engineering 187
  • Mechanics of Materials 98
  • General Materials Science 5
Replace Ramnath Venkatraman with:
Ramnath Venkatraman United States
D. P. Tracy United States
C. Liu United Kingdom
N. Owada Japan
P. A. Totta United States
H. Berg United States
D. Barbier France
S. Nagata Japan
C. Y. Liu United States
W. Robl Germany
C.-Y. Li relative to Ramnath Venkatraman United States Ramnath Venkatraman's profile →
Citations per field
00.5×
Ramnath Venkatraman · 1×
Citations per year

Countries citing papers authored by C.-Y. Li

Since Specialization
Citations

This map shows the geographic impact of C.-Y. Li's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C.-Y. Li with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C.-Y. Li more than expected).

Fields of papers citing papers by C.-Y. Li

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C.-Y. Li. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C.-Y. Li. The network helps show where C.-Y. Li may publish in the future.

Co-authors

The 24 scholars most cited alongside C.-Y. Li, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with C.-Y. Li Line = papers co-authored together C.-Y. Li links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 44 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200057
2 199255
3 199840
4 199140
5 198929
6 199623
7 198718
8 198717
9 199515
10 199315
11 199215
12 199313
13 199913
14 199213
15 199212
16 199310
17 19919
18 19959
19 20037
20 19936

About C.-Y. Li

C.-Y. Li is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Mechanical Engineering, Mechanics of Materials and Materials Chemistry, having authored 44 papers that have together received 487 indexed citations. Recurring topics across this work include Electronic Packaging and Soldering Technologies (26 papers), Copper Interconnects and Reliability (17 papers), 3D IC and TSV technologies (13 papers), Advanced Welding Techniques Analysis (6 papers), Semiconductor materials and devices (5 papers), Metal and Thin Film Mechanics (4 papers), Aluminum Alloy Microstructure Properties (4 papers) and Semiconductor materials and interfaces (4 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (198 citations), Electrical and Electronic Engineering (401 citations), Mechanical Engineering (187 citations), Mechanics of Materials (98 citations) and General Materials Science (5 citations). C.-Y. Li has collaborated with scholars based in United States, Australia and Germany. Frequent co-authors include M. A. Korhonen, P. Bo rgesen, Peter Børgesen, Tia‐Marje Korhonen, Sukwon Hong, Peng Su, D. D. Brown, Timothy D. Sullivan, J. W. Mayer and Sven Rzepka. Their work appears in journals such as Applied Physics Letters, Journal of Electronic Materials, Journal of Electronic Packaging, Scripta Materialia and Journal of materials research/Pratt's guide to venture capital sources.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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