Peter Børgesen

209 papers receiving 3.2k citations

Peers

Peter Børgesen
Comparison fields: 5 of 78
  • Electrical and Electronic Engineering 2.4k
  • General Materials Science 121
  • Mechanical Engineering 1.3k
  • Mechanics of Materials 601
  • Radiation 201
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I. C. Noyan United States
Lance L. Snead United States
James E. Bernard United States
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Citations per year

Countries citing papers authored by Peter Børgesen

Since Specialization
Citations

This map shows the geographic impact of Peter Børgesen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Peter Børgesen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Peter Børgesen more than expected).

Fields of papers citing papers by Peter Børgesen

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Peter Børgesen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Peter Børgesen. The network helps show where Peter Børgesen may publish in the future.

Co-authors

The 25 scholars most cited alongside Peter Børgesen, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Peter Børgesen Line = papers co-authored together Peter Børgesen links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 214 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2004157
2 2017130
3 2001109
4
Beam-solid interactions, physical phenomena
1990107
5 201199
6 201698
7 201196
8 200875
9 198754
10 198650
11 200750
12 202249
13 201448
14 201644
15 197843
16 201843
17 200843
18 201543
19 201341
20 201040

About Peter Børgesen

Peter Børgesen is a scholar working on Electrical and Electronic Engineering, Mechanical Engineering, Mechanics of Materials, Materials Chemistry and Aerospace Engineering, having authored 214 papers that have together received 3.4k indexed citations. Recurring topics across this work include Electronic Packaging and Soldering Technologies (119 papers), 3D IC and TSV technologies (43 papers), Ion-surface interactions and analysis (24 papers), Aluminum Alloy Microstructure Properties (22 papers), Advanced Welding Techniques Analysis (20 papers), Copper Interconnects and Reliability (20 papers), Fusion materials and technologies (19 papers) and Additive Manufacturing and 3D Printing Technologies (17 papers). The work is most often cited by research in Electrical and Electronic Engineering (2.4k citations), General Materials Science (121 citations), Mechanical Engineering (1.3k citations), Mechanics of Materials (601 citations) and Radiation (201 citations). Peter Børgesen has collaborated with scholars based in United States, Germany and Denmark. Frequent co-authors include Liang Yin, E. J. Cotts, Sa’d Hamasha, Luke Wentlent, B.M.U. Scherzer, Awni Qasaimeh, Nikolay Dimitrov, W. Möller, L. Zavalij and Babak Arfaei. Their work appears in journals such as Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Journal of Electronic Packaging, IEEE Transactions on Components Packaging and Manufacturing Technology, Journal of Electronic Materials and Microelectronics Reliability.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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