Andrei Shibkov
Impact in
-
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Electrostatic Discharge in Electronics
- Electromagnetic Compatibility and Noise Suppression
- Silicon Carbide Semiconductor Technologies
- Ferroelectric and Negative Capacitance Devices
Papers in
-
- Electrostatic Discharge in Electronics 25
- Integrated Circuits and Semiconductor Failure Analysis 18
- Semiconductor materials and devices 14
- Electromagnetic Compatibility and Noise Suppression 10
- Silicon Carbide Semiconductor Technologies 8
- Advancements in Semiconductor Devices and Circuit Design 8
- VLSI and FPGA Design Techniques 3
- 3D IC and TSV technologies 2
- Co-authors
- Vladislav A. Vashchenko (18 shared papers)M. Ershov (3 shared papers)Jeffrey A. Babcock (2 shared papers)Paul A. Clifton (2 shared papers)Sharad Saxena (5 shared papers)S. Minehane (2 shared papers)V. Ryzhii (1 shared paper)Takashi Yamashita (1 shared paper)
- Journals
- Applied Physics Letters (1 paper)Microelectronics Reliability (1 paper)Electronics Letters (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (2 papers)Electrical Overstress/Electrostatic Discharge Symposium (3 papers)
- Partner nations
- United StatesCanadaJapan
In The Last Decade
Andrei Shibkov
32 papers receiving 295 citations
Peers
Comparison fields: 5 of 18
- Electrical and Electronic Engineering 305
- Hardware and Architecture 26
- Atomic and Molecular Physics, and Optics 29
- Surfaces, Coatings and Films 2
- Safety, Risk, Reliability and Quality 2
Countries citing papers authored by Andrei Shibkov
This map shows the geographic impact of Andrei Shibkov's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Andrei Shibkov with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Andrei Shibkov more than expected).
Fields of papers citing papers by Andrei Shibkov
This network shows the impact of papers produced by Andrei Shibkov. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Andrei Shibkov. The network helps show where Andrei Shibkov may publish in the future.
Co-authors
The 25 scholars most cited alongside Andrei Shibkov, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 37 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2003 | 144 | |
| 2 | 2010 | 53 | |
| 3 | 2003 | 26 | |
| 4 | 1992 | 9 | |
| 5 | 2005 | 8 | |
| 6 | 2003 | 8 | |
| 7 | 2010 | 7 | |
| 8 | Mixed-mode simulations for power-on ESD analysis | 2012 | 5 |
| 9 | 2015 | 4 | |
| 10 | SCR clamps with transient voltage detection driver | 2012 | 4 |
| 11 | 2005 | 4 | |
| 12 | 2011 | 4 | |
| 13 | 2002 | 3 | |
| 14 | Active clamp implementation in complementary BiCMOS process with high voltage BJT devices | 2011 | 3 |
| 15 | 2010 | 3 | |
| 16 | 2018 | 3 | |
| 17 | Effect of process technology variation on ESD clamp parameters | 2014 | 3 |
| 18 | 2005 | 3 | |
| 19 | 2022 | 2 | |
| 20 | 2011 | 2 |
About Andrei Shibkov
Andrei Shibkov is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Aerospace Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry, having authored 37 papers that have together received 313 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (25 papers), Integrated Circuits and Semiconductor Failure Analysis (18 papers), Semiconductor materials and devices (14 papers), Electromagnetic Compatibility and Noise Suppression (10 papers), Silicon Carbide Semiconductor Technologies (8 papers), Advancements in Semiconductor Devices and Circuit Design (8 papers), VLSI and FPGA Design Techniques (3 papers) and 3D IC and TSV technologies (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (305 citations), Hardware and Architecture (26 citations), Atomic and Molecular Physics, and Optics (29 citations), Surfaces, Coatings and Films (2 citations) and Safety, Risk, Reliability and Quality (2 citations). Andrei Shibkov has collaborated with scholars based in United States, Canada and Japan. Frequent co-authors include Vladislav A. Vashchenko, M. Ershov, Jeffrey A. Babcock, Paul A. Clifton, Sharad Saxena, S. Minehane, V. Ryzhii, Takashi Yamashita, S. Thijs and Robert C. Pack. Their work appears in journals such as Applied Physics Letters, Microelectronics Reliability, Electronics Letters, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE and Electrical Overstress/Electrostatic Discharge Symposium.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.