R.K. Treece
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
-
- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
- Electrostatic Discharge in Electronics
Papers in
-
- Radiation Effects in Electronics 11
- Integrated Circuits and Semiconductor Failure Analysis 9
- Advancements in Semiconductor Devices and Circuit Design 5
- Semiconductor materials and devices 4
- Low-power high-performance VLSI design 3
- Electrostatic Discharge in Electronics 2
-
- VLSI and Analog Circuit Testing 7
- Physical Unclonable Functions (PUFs) and Hardware Security 2
- Co-authors
- J.M. Soden (5 shared papers)C.F. Hawkins (4 shared papers)F.W. Sexton (5 shared papers)G.L. Hash (4 shared papers)Wayne T. Corbett (4 shared papers)K.L. Hughes (3 shared papers)Carl L. Axness (3 shared papers)P. J. McWhorter (1 shared paper)
- Journals
- IEEE Transactions on Nuclear Science (8 papers)OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) (5 papers)International Test Conference (1 paper)
- Partner nations
- United States
In The Last Decade
R.K. Treece
16 papers receiving 237 citations
Peers
Comparison fields: 5 of 21
- Hardware and Architecture 170
- Electrical and Electronic Engineering 262
- Software 7
- Radiation 5
- Safety, Risk, Reliability and Quality 5
Countries citing papers authored by R.K. Treece
This map shows the geographic impact of R.K. Treece's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R.K. Treece with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R.K. Treece more than expected).
Fields of papers citing papers by R.K. Treece
This network shows the impact of papers produced by R.K. Treece. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R.K. Treece. The network helps show where R.K. Treece may publish in the future.
Co-authors
The 23 scholars most cited alongside R.K. Treece, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | Increased CMOS IC stuck-at fault coverage with reduced I DDQ test sets. | 1990 | 61 |
| 2 | 1986 | 40 | |
| 3 | 2002 | 31 | |
| 4 | 2003 | 31 | |
| 5 | 1991 | 28 | |
| 6 | 1989 | 15 | |
| 7 | 1983 | 13 | |
| 8 | 1985 | 13 | |
| 9 | 1983 | 8 | |
| 10 | VLSI modeling and design for radiation environments | 1986 | 8 |
| 11 | 1991 | 7 | |
| 12 | 1990 | 7 | |
| 13 | 1990 | 2 | |
| 14 | SEU response of design- and resistor-hardened D-latches in the SA3300 microprocessor | 1991 | 2 |
| 15 | SEU immune ICs for project Galileo | 1985 | 2 |
| 16 | Electrical measurements for CMOS IC stuck-open faults | 1989 | 1 |
About R.K. Treece
R.K. Treece is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Molecular Biology, Automotive Engineering and Materials Chemistry, having authored 16 papers that have together received 269 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (11 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers), VLSI and Analog Circuit Testing (7 papers), Advancements in Semiconductor Devices and Circuit Design (5 papers), Semiconductor materials and devices (4 papers), Low-power high-performance VLSI design (3 papers), Physical Unclonable Functions (PUFs) and Hardware Security (2 papers) and Electrostatic Discharge in Electronics (2 papers). The work is most often cited by research in Hardware and Architecture (170 citations), Electrical and Electronic Engineering (262 citations), Software (7 citations), Radiation (5 citations) and Safety, Risk, Reliability and Quality (5 citations). R.K. Treece has collaborated with scholars based in United States. Frequent co-authors include J.M. Soden, C.F. Hawkins, F.W. Sexton, G.L. Hash, Wayne T. Corbett, K.L. Hughes, Carl L. Axness, P. J. McWhorter, Daniel M. Fleetwood and J.R. Schwank. Their work appears in journals such as IEEE Transactions on Nuclear Science, OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) and International Test Conference.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.