C.F. Hawkins

46 papers and 849 indexed citations i.

C.F. Hawkins is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, C.F. Hawkins has authored 46 papers receiving a total of 849 indexed citations (citations by other indexed papers that have themselves been cited), including 38 papers in Electrical and Electronic Engineering, 24 papers in Hardware and Architecture and 3 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in C.F. Hawkins’s work include Integrated Circuits and Semiconductor Failure Analysis (34 papers), VLSI and Analog Circuit Testing (24 papers) and Semiconductor materials and devices (19 papers). C.F. Hawkins is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (34 papers), VLSI and Analog Circuit Testing (24 papers) and Semiconductor materials and devices (19 papers). C.F. Hawkins collaborates with scholars based in United States, Canada and Spain. C.F. Hawkins's co-authors include J.M. Soden, R. K. Gulati, Alan Righter, Weiwei Mao, F.J. Ferguson, R.K. Treece, A. Keshavarzi, H. Troy Nagle, Kaushik Roy and J. Segura and has published in prestigious journals such as Gut, IEEE Transactions on Industrial Electronics and Electronics Letters.