P.J. Tobin

1.3k citations
42 papers · 883 · h-index 13

Impact in

Papers in

    • Semiconductor materials and devices 33
    • Advancements in Semiconductor Devices and Circuit Design 24
    • Integrated Circuits and Semiconductor Failure Analysis 20
    • Silicon and Solar Cell Technologies 5
    • Thin-Film Transistor Technologies 3
    • Ferroelectric and Negative Capacitance Devices 3
    • Semiconductor materials and interfaces 5

P.J. Tobin

38 papers receiving 829 citations

Peers

P.J. Tobin
Comparison fields: 5 of 66
  • Electrical and Electronic Engineering 791
  • Atomic and Molecular Physics, and Optics 178
  • Surfaces, Coatings and Films 27
  • Materials Chemistry 172
  • Electronic, Optical and Magnetic Materials 45
Replace R.E. Proano with:
R.E. Proano United States
R. T. Fulks United States
K.H. Zaininger United States
Steven C. Shatas United States
D. Bouvet Switzerland
W. Bergholz Germany
M. Hoshino Japan
G.F. Derbenwick United States
Y.J. Park South Korea
Shin‐ichiro Uekusa Japan
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Citations per field
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Citations per year

Countries citing papers authored by P.J. Tobin

Since Specialization
Citations

This map shows the geographic impact of P.J. Tobin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P.J. Tobin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P.J. Tobin more than expected).

Fields of papers citing papers by P.J. Tobin

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P.J. Tobin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P.J. Tobin. The network helps show where P.J. Tobin may publish in the future.

Co-authors

The 25 scholars most cited alongside P.J. Tobin, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with P.J. Tobin Line = papers co-authored together P.J. Tobin links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 42 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2004182
2 1990151
3 2004135
4 199959
5 201754
6 200543
7 197929
8 200625
9 199121
10 200520
11 200014
12 198613
13 199912
14 199911
15 199911
16 20009
17 19869
18 19879
19 19968
20 20027

About P.J. Tobin

P.J. Tobin is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Materials Chemistry and Computational Mechanics, having authored 42 papers that have together received 883 indexed citations. Recurring topics across this work include Semiconductor materials and devices (33 papers), Advancements in Semiconductor Devices and Circuit Design (24 papers), Integrated Circuits and Semiconductor Failure Analysis (20 papers), Semiconductor materials and interfaces (5 papers), Silicon and Solar Cell Technologies (5 papers), Copper Interconnects and Reliability (4 papers), Thin-Film Transistor Technologies (3 papers) and Ferroelectric and Negative Capacitance Devices (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (791 citations), Atomic and Molecular Physics, and Optics (178 citations), Surfaces, Coatings and Films (27 citations), Materials Chemistry (172 citations) and Electronic, Optical and Magnetic Materials (45 citations). P.J. Tobin has collaborated with scholars based in United States. Frequent co-authors include H.‐H. Tseng, J. M. Grant, R. I. Hegde, D. C. Gilmer, Dina H. Triyoso, Sheena D. Brown, J.D. Hayden, B. E. White, James W. Miller and Rachel E. White. Their work appears in journals such as Journal of The Electrochemical Society, IEEE Transactions on Electron Devices, IEEE Transactions on Device and Materials Reliability, IEEE Electron Device Letters and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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