P. Perdu
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
- Physical Unclonable Functions (PUFs) and Hardware Security
-
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 117
- Semiconductor materials and devices 24
-
- Near-Field Optical Microscopy 24
- Advanced Surface Polishing Techniques 19
- Co-authors
- F. Beaudoin (39 shared papers)D. Lewis (41 shared papers)V. Pouget (7 shared papers)P. Fouillat (9 shared papers)F. Darracq (5 shared papers)Lionel Torres (2 shared papers)Michel Vallet (9 shared papers)Bruno Rouzeyre (2 shared papers)
- Journals
- Microelectronics Reliability (54 papers)IEEE Transactions on Device and Materials Reliability (2 papers)IEEE Transactions on Nuclear Science (2 papers)Microelectronic Engineering (1 paper)Journal of Electronic Packaging (1 paper)
- Partner nations
- FranceSwitzerlandSingapore
In The Last Decade
P. Perdu
117 papers receiving 562 citations
Peers
Comparison fields: 5 of 50
- Hardware and Architecture 164
- Electrical and Electronic Engineering 532
- Industrial and Manufacturing Engineering 49
- Biomedical Engineering 187
- Atomic and Molecular Physics, and Optics 122
Countries citing papers authored by P. Perdu
This map shows the geographic impact of P. Perdu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Perdu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Perdu more than expected).
Fields of papers citing papers by P. Perdu
This network shows the impact of papers produced by P. Perdu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Perdu. The network helps show where P. Perdu may publish in the future.
Co-authors
The 25 scholars most cited alongside P. Perdu, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 128 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2006 | 32 | |
| 2 | 2008 | 27 | |
| 3 | 2010 | 27 | |
| 4 | 2005 | 23 | |
| 5 | 2006 | 20 | |
| 6 | 2005 | 17 | |
| 7 | 2001 | 17 | |
| 8 | 2009 | 15 | |
| 9 | 2001 | 13 | |
| 10 | 2006 | 12 | |
| 11 | 2006 | 12 | |
| 12 | 2000 | 12 | |
| 13 | 2002 | 11 | |
| 14 | 2000 | 11 | |
| 15 | 2013 | 10 | |
| 16 | 2007 | 10 | |
| 17 | 2007 | 9 | |
| 18 | 2002 | 9 | |
| 19 | 2003 | 9 | |
| 20 | 2003 | 8 |
About P. Perdu
P. Perdu is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Atomic and Molecular Physics, and Optics, Hardware and Architecture and Computational Mechanics, having authored 128 papers that have together received 614 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (117 papers), Force Microscopy Techniques and Applications (29 papers), Semiconductor materials and devices (24 papers), Near-Field Optical Microscopy (24 papers), VLSI and Analog Circuit Testing (21 papers), Advanced Surface Polishing Techniques (19 papers), Electron and X-Ray Spectroscopy Techniques (17 papers) and Industrial Vision Systems and Defect Detection (15 papers). The work is most often cited by research in Hardware and Architecture (164 citations), Electrical and Electronic Engineering (532 citations), Industrial and Manufacturing Engineering (49 citations), Biomedical Engineering (187 citations) and Atomic and Molecular Physics, and Optics (122 citations). P. Perdu has collaborated with scholars based in France, Switzerland and Singapore. Frequent co-authors include F. Beaudoin, D. Lewis, V. Pouget, P. Fouillat, F. Darracq, Lionel Torres, Michel Vallet, Bruno Rouzeyre, Marise Bafleur and Nathalie Labat. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Nuclear Science, Microelectronic Engineering and Journal of Electronic Packaging.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.