P. Perdu
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
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- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Electrostatic Discharge in Electronics
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 115
- Semiconductor materials and devices 24
-
- Near-Field Optical Microscopy 23
- Advanced Surface Polishing Techniques 19
- Co-authors
- F. Beaudoin (39 shared papers)D. Lewis (41 shared papers)V. Pouget (7 shared papers)P. Fouillat (9 shared papers)F. Darracq (5 shared papers)Marise Bafleur (6 shared papers)David Trémouilles (7 shared papers)Michel Vallet (9 shared papers)
- Journals
- Microelectronics Reliability (54 papers)IEEE Transactions on Device and Materials Reliability (2 papers)IEEE Transactions on Nuclear Science (2 papers)Microelectronic Engineering (1 paper)IEEE Transactions on Semiconductor Manufacturing (1 paper)
- Partner nations
- FranceSwitzerlandSingapore
In The Last Decade
P. Perdu
116 papers receiving 507 citations
Peers
Comparison fields: 5 of 49
- Hardware and Architecture 133
- Electrical and Electronic Engineering 487
- Industrial and Manufacturing Engineering 44
- Biomedical Engineering 176
- Atomic and Molecular Physics, and Optics 112
Countries citing papers authored by P. Perdu
This map shows the geographic impact of P. Perdu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Perdu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Perdu more than expected).
Fields of papers citing papers by P. Perdu
This network shows the impact of papers produced by P. Perdu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Perdu. The network helps show where P. Perdu may publish in the future.
Co-authors
The 25 scholars most cited alongside P. Perdu, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 126 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2006 | 31 | |
| 2 | 2008 | 26 | |
| 3 | 2005 | 21 | |
| 4 | 2006 | 20 | |
| 5 | 2001 | 17 | |
| 6 | 2009 | 15 | |
| 7 | 2005 | 13 | |
| 8 | 2001 | 12 | |
| 9 | 2002 | 11 | |
| 10 | 2006 | 11 | |
| 11 | 2000 | 10 | |
| 12 | 2007 | 10 | |
| 13 | 2007 | 9 | |
| 14 | 2000 | 9 | |
| 15 | 2003 | 9 | |
| 16 | 2006 | 8 | |
| 17 | 2002 | 8 | |
| 18 | 2013 | 8 | |
| 19 | 2003 | 8 | |
| 20 | 2000 | 8 |
About P. Perdu
P. Perdu is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Atomic and Molecular Physics, and Optics, Hardware and Architecture and Computational Mechanics, having authored 126 papers that have together received 544 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (115 papers), Force Microscopy Techniques and Applications (28 papers), Semiconductor materials and devices (24 papers), Near-Field Optical Microscopy (23 papers), VLSI and Analog Circuit Testing (21 papers), Advanced Surface Polishing Techniques (19 papers), Electron and X-Ray Spectroscopy Techniques (17 papers) and Industrial Vision Systems and Defect Detection (15 papers). The work is most often cited by research in Hardware and Architecture (133 citations), Electrical and Electronic Engineering (487 citations), Industrial and Manufacturing Engineering (44 citations), Biomedical Engineering (176 citations) and Atomic and Molecular Physics, and Optics (112 citations). P. Perdu has collaborated with scholars based in France, Switzerland and Singapore. Frequent co-authors include F. Beaudoin, D. Lewis, V. Pouget, P. Fouillat, F. Darracq, Marise Bafleur, David Trémouilles, Michel Vallet, Michel Bonnet and Mohsine Bouya. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Nuclear Science, Microelectronic Engineering and IEEE Transactions on Semiconductor Manufacturing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.