D. Lewis
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
-
- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Electrostatic Discharge in Electronics
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 69
- Semiconductor materials and devices 18
- Radiation Effects in Electronics 17
- Electrostatic Discharge in Electronics 13
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- Advanced Surface Polishing Techniques 12
- Near-Field Optical Microscopy 11
- Co-authors
- V. Pouget (29 shared papers)P. Fouillat (19 shared papers)P. Perdu (41 shared papers)H. Lapuyade (8 shared papers)F. Beaudoin (19 shared papers)F. Darracq (11 shared papers)A. Touboul (6 shared papers)Véronique Quintard (9 shared papers)
- Journals
- Microelectronics Reliability (27 papers)IEEE Transactions on Nuclear Science (11 papers)Quality and Reliability Engineering International (4 papers)IEEE Transactions on Device and Materials Reliability (2 papers)Measurement Science and Technology (1 paper)
- Partner nations
- FranceUnited StatesSwitzerland
In The Last Decade
D. Lewis
86 papers receiving 670 citations
Peers
Comparison fields: 5 of 50
- Hardware and Architecture 181
- Electrical and Electronic Engineering 626
- Instrumentation 19
- Computational Mechanics 107
- Biomedical Engineering 151
Countries citing papers authored by D. Lewis
This map shows the geographic impact of D. Lewis's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Lewis with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Lewis more than expected).
Fields of papers citing papers by D. Lewis
This network shows the impact of papers produced by D. Lewis. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Lewis. The network helps show where D. Lewis may publish in the future.
Co-authors
The 25 scholars most cited alongside D. Lewis, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 91 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2001 | 63 | |
| 2 | 2003 | 48 | |
| 3 | 2001 | 46 | |
| 4 | 1996 | 44 | |
| 5 | 2006 | 31 | |
| 6 | 1999 | 27 | |
| 7 | 2004 | 27 | |
| 8 | 2011 | 25 | |
| 9 | 2000 | 22 | |
| 10 | 2006 | 20 | |
| 11 | 2009 | 19 | |
| 12 | 2011 | 19 | |
| 13 | 2009 | 15 | |
| 14 | 2002 | 13 | |
| 15 | 2012 | 12 | |
| 16 | 2013 | 12 | |
| 17 | 1997 | 9 | |
| 18 | 2008 | 9 | |
| 19 | 1998 | 9 | |
| 20 | 2009 | 9 |
About D. Lewis
D. Lewis is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Atomic and Molecular Physics, and Optics, Hardware and Architecture and Computational Mechanics, having authored 91 papers that have together received 704 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (69 papers), Semiconductor materials and devices (18 papers), Force Microscopy Techniques and Applications (17 papers), Radiation Effects in Electronics (17 papers), VLSI and Analog Circuit Testing (14 papers), Electrostatic Discharge in Electronics (13 papers), Advanced Surface Polishing Techniques (12 papers) and Near-Field Optical Microscopy (11 papers). The work is most often cited by research in Hardware and Architecture (181 citations), Electrical and Electronic Engineering (626 citations), Instrumentation (19 citations), Computational Mechanics (107 citations) and Biomedical Engineering (151 citations). D. Lewis has collaborated with scholars based in France, United States and Switzerland. Frequent co-authors include V. Pouget, P. Fouillat, P. Perdu, H. Lapuyade, F. Beaudoin, F. Darracq, A. Touboul, Véronique Quintard, S. Dilhaire and W. Claeys. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Nuclear Science, Quality and Reliability Engineering International, IEEE Transactions on Device and Materials Reliability and Measurement Science and Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.