D. Lewis
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
- Physical Unclonable Functions (PUFs) and Hardware Security
-
- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- Semiconductor materials and devices
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 95
- Radiation Effects in Electronics 24
- Semiconductor materials and devices 24
- Electrostatic Discharge in Electronics 14
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- VLSI and Analog Circuit Testing 24
- Co-authors
- V. Pouget (45 shared papers)P. Fouillat (32 shared papers)P. Perdu (55 shared papers)H. Lapuyade (10 shared papers)Felix Beaudoin (23 shared papers)F. Darracq (17 shared papers)Véronique Quintard (9 shared papers)S. Dilhaire (10 shared papers)
- Journals
- Microelectronics Reliability (27 papers)IEEE Transactions on Nuclear Science (11 papers)Quality and Reliability Engineering International (4 papers)IEEE Transactions on Device and Materials Reliability (2 papers)IEEE Transactions on Semiconductor Manufacturing (1 paper)
- Partner nations
- FranceUnited StatesSwitzerland
In The Last Decade
D. Lewis
117 papers receiving 924 citations
Peers
Comparison fields: 5 of 51
- Hardware and Architecture 305
- Electrical and Electronic Engineering 867
- Instrumentation 23
- Computational Mechanics 122
- Biomedical Engineering 221
Countries citing papers authored by D. Lewis
This map shows the geographic impact of D. Lewis's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Lewis with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Lewis more than expected).
Fields of papers citing papers by D. Lewis
This network shows the impact of papers produced by D. Lewis. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Lewis. The network helps show where D. Lewis may publish in the future.
Co-authors
The 25 scholars most cited alongside D. Lewis, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 122 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2001 | 69 | |
| 2 | 1996 | 54 | |
| 3 | 2001 | 54 | |
| 4 | 2003 | 48 | |
| 5 | 2006 | 38 | |
| 6 | 2004 | 36 | |
| 7 | 1999 | 33 | |
| 8 | 2011 | 27 | |
| 9 | 2000 | 27 | |
| 10 | 2009 | 25 | |
| 11 | 2005 | 24 | |
| 12 | 2006 | 21 | |
| 13 | 2011 | 20 | |
| 14 | 2007 | 16 | |
| 15 | 2002 | 15 | |
| 16 | 2009 | 15 | |
| 17 | 2008 | 14 | |
| 18 | 2013 | 14 | |
| 19 | TOOLS AND METHODOLOGY DEVELOPMENT FOR PULSED LASER FAULT INJECTION IN SRAM-BASED FPGAS | 2007 | 14 |
| 20 | 2012 | 14 |
About D. Lewis
D. Lewis is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Atomic and Molecular Physics, and Optics, Computational Mechanics and Biomedical Engineering, having authored 122 papers that have together received 972 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (95 papers), VLSI and Analog Circuit Testing (24 papers), Radiation Effects in Electronics (24 papers), Semiconductor materials and devices (24 papers), Force Microscopy Techniques and Applications (21 papers), Near-Field Optical Microscopy (17 papers), Advanced Surface Polishing Techniques (15 papers) and Electrostatic Discharge in Electronics (14 papers). The work is most often cited by research in Hardware and Architecture (305 citations), Electrical and Electronic Engineering (867 citations), Instrumentation (23 citations), Computational Mechanics (122 citations) and Biomedical Engineering (221 citations). D. Lewis has collaborated with scholars based in France, United States and Switzerland. Frequent co-authors include V. Pouget, P. Fouillat, P. Perdu, H. Lapuyade, Felix Beaudoin, F. Darracq, Véronique Quintard, S. Dilhaire, A. Touboul and Stephen P Buchner. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Nuclear Science, Quality and Reliability Engineering International, IEEE Transactions on Device and Materials Reliability and IEEE Transactions on Semiconductor Manufacturing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.