Norbert Seifert

3.3k citations
60 papers · 2.6k · 1 hit paper · h-index 23

Impact in

    • VLSI and Analog Circuit Testing
    • Radiation Effects in Electronics
    • Semiconductor materials and devices
    • Low-power high-performance VLSI design
    • Integrated Circuits and Semiconductor Failure Analysis
    • Advancements in Semiconductor Devices and Circuit Design

Papers in

Norbert Seifert

59 papers receiving 2.5k citations

Norbert Seifert's Hit Papers

Robust system design with built-in soft-error resilience 2005 · 445 citations
4450+7+14Years since publication100200300400

Peers

Norbert Seifert
Comparison fields: 5 of 63
  • Hardware and Architecture 1.5k
  • Electrical and Electronic Engineering 2.4k
  • Safety, Risk, Reliability and Quality 189
  • Software 62
  • Computer Networks and Communications 268
Replace Shi-Jie Wen with:
Shi-Jie Wen United States
Murray H. Woods United States
Michael L. Alles United States
T.C. May United States
Bharat L. Bhuva United States
Véronique Ferlet-Cavrois Netherlands
Vincent Pouget France
Gerald L. Hash United States
Joseph Bernstein United States
F. Miller France
Norbert Seifert relative to Shi-Jie Wen United States Shi-Jie Wen's profile →
Citations per field
00.5×1.5×2×2.5×
Shi-Jie Wen · 1×
Citations per year

Countries citing papers authored by Norbert Seifert

Since Specialization
Citations

This map shows the geographic impact of Norbert Seifert's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Norbert Seifert with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Norbert Seifert more than expected).

Fields of papers citing papers by Norbert Seifert

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Norbert Seifert. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Norbert Seifert. The network helps show where Norbert Seifert may publish in the future.

Co-authors

The 25 scholars most cited alongside Norbert Seifert, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Norbert Seifert Line = papers co-authored together Norbert Seifert links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 60 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Robust system design with built-in soft-error resilience
Hit paper breakdown →
2005445
2 2006176
3 2006171
4 2012159
5 2006133
6 2002133
7 2010105
8 201598
9 200496
10 200594
11 200989
12 200280
13 200876
14 200764
15 200260
16 200559
17 200545
18 200744
19 200640
20 200636

About Norbert Seifert

Norbert Seifert is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Computational Mechanics, Safety, Risk, Reliability and Quality and Atomic and Molecular Physics, and Optics, having authored 60 papers that have together received 2.6k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (38 papers), VLSI and Analog Circuit Testing (23 papers), Semiconductor materials and devices (22 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers), Ion-surface interactions and analysis (10 papers), Reliability and Maintenance Optimization (6 papers), Low-power high-performance VLSI design (5 papers) and Laser-induced spectroscopy and plasma (4 papers). The work is most often cited by research in Hardware and Architecture (1.5k citations), Electrical and Electronic Engineering (2.4k citations), Safety, Risk, Reliability and Quality (189 citations), Software (62 citations) and Computer Networks and Communications (268 citations). Norbert Seifert has collaborated with scholars based in United States, Austria and Israel. Frequent co-authors include Subhasish Mitra, B. Gill, Qi Shi, Kee Sup Kim, Ming Zhang, Vinod Ambrose, Lloyd W. Massengill, Xiao‐Wei Zhu, Shah M. Jahinuzzaman and Quan Shi. Their work appears in journals such as IEEE Transactions on Nuclear Science, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Applied Surface Science, IEEE Transactions on Device and Materials Reliability and IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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