T.C. May
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
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- Radiation Effects in Electronics
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
- Advanced Memory and Neural Computing
Papers in
-
- Radiation Effects in Electronics 6
- Semiconductor materials and devices 5
- Integrated Circuits and Semiconductor Failure Analysis 3
- Low-power high-performance VLSI design 1
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- Radiation Detection and Scintillator Technologies 1
- Co-authors
- M. H. Woods (2 shared papers)A.M. Mohsen (2 shared papers)Eugene S. Meieran (2 shared papers)G. Scott (1 shared paper)Valluri Rao (1 shared paper)
- Journals
- IEEE Transactions on Electron Devices (2 papers)IEEE Transactions on Components Hybrids and Manufacturing Technology (1 paper)Reliability physics (2 papers)
- Partner nations
- United States
In The Last Decade
T.C. May
7 papers receiving 805 citations
T.C. May's Hit Papers
Peers
Comparison fields: 5 of 49
- Hardware and Architecture 302
- Electrical and Electronic Engineering 779
- Radiation 66
- Software 25
- Computer Networks and Communications 109
Countries citing papers authored by T.C. May
This map shows the geographic impact of T.C. May's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T.C. May with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T.C. May more than expected).
Fields of papers citing papers by T.C. May
This network shows the impact of papers produced by T.C. May. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T.C. May. The network helps show where T.C. May may publish in the future.
Co-authors
The 5 scholars most cited alongside T.C. May, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | Alpha-particle-induced soft errors in dynamic memories Hit paper breakdown → | 1979 | 601 |
| 2 | 1978 | 148 | |
| 3 | 1984 | 34 | |
| 4 | 1979 | 33 | |
| 5 | 1985 | 28 | |
| 6 | 1979 | 10 | |
| 7 | 1982 | 4 |
About T.C. May
T.C. May is a scholar working on Electrical and Electronic Engineering, Radiation, Safety, Risk, Reliability and Quality, Surfaces, Coatings and Films and Materials Chemistry, having authored 7 papers that have together received 858 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (6 papers), Semiconductor materials and devices (5 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Nuclear and radioactivity studies (1 paper), Electron and X-Ray Spectroscopy Techniques (1 paper), Radiation Detection and Scintillator Technologies (1 paper), Low-power high-performance VLSI design (1 paper) and Graphite, nuclear technology, radiation studies (1 paper). The work is most often cited by research in Hardware and Architecture (302 citations), Electrical and Electronic Engineering (779 citations), Radiation (66 citations), Software (25 citations) and Computer Networks and Communications (109 citations). T.C. May has collaborated with scholars based in United States. Frequent co-authors include M. H. Woods, A.M. Mohsen, Eugene S. Meieran, G. Scott and Valluri Rao. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Transactions on Components Hybrids and Manufacturing Technology and Reliability physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.