Joseph Bernstein
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- Electrostatic Discharge in Electronics
- Radiation Effects in Electronics
- Electromagnetic Compatibility and Noise Suppression
- Ferroelectric and Negative Capacitance Devices
- Hardware and Architecture top 5%
Papers in
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- Semiconductor materials and devices 78
- Integrated Circuits and Semiconductor Failure Analysis 68
- Advancements in Semiconductor Devices and Circuit Design 55
- Silicon Carbide Semiconductor Technologies 16
- Electronic Packaging and Soldering Technologies 14
- Electrostatic Discharge in Electronics 12
- Co-authors
- Jin Qin (12 shared papers)Xiaojun Li (7 shared papers)John S. Suehle (21 shared papers)Eric M. Vogel (16 shared papers)Moshe Gurfinkel (9 shared papers)Yoram Shapira (6 shared papers)Neil Goldsman (5 shared papers)Aivars J. Lelis (5 shared papers)
- Journals
- Microelectronics Reliability (9 papers)IEEE Transactions on Device and Materials Reliability (6 papers)IEEE Transactions on Electron Devices (6 papers)IEEE Electron Device Letters (5 papers)IEEE Transactions on Semiconductor Manufacturing (4 papers)
- Partner nations
- United StatesIsraelChina
In The Last Decade
Joseph Bernstein
131 papers receiving 1.8k citations
Peers
Comparison fields: 5 of 82
- Electrical and Electronic Engineering 1.6k
- Hardware and Architecture 142
- Software 42
- Safety, Risk, Reliability and Quality 57
- Statistics, Probability and Uncertainty 35
Countries citing papers authored by Joseph Bernstein
This map shows the geographic impact of Joseph Bernstein's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Joseph Bernstein with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Joseph Bernstein more than expected).
Fields of papers citing papers by Joseph Bernstein
This network shows the impact of papers produced by Joseph Bernstein. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Joseph Bernstein. The network helps show where Joseph Bernstein may publish in the future.
Co-authors
The 25 scholars most cited alongside Joseph Bernstein, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 142 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2008 | 142 | |
| 2 | 2006 | 128 | |
| 3 | 2008 | 110 | |
| 4 | 2002 | 70 | |
| 5 | 2006 | 60 | |
| 6 | 2008 | 58 | |
| 7 | 1991 | 53 | |
| 8 | 2007 | 49 | |
| 9 | 2000 | 47 | |
| 10 | 2002 | 43 | |
| 11 | 2001 | 42 | |
| 12 | 2000 | 39 | |
| 13 | 2006 | 35 | |
| 14 | 1993 | 35 | |
| 15 | 2002 | 34 | |
| 16 | 1963 | 32 | |
| 17 | 2009 | 31 | |
| 18 | 2004 | 26 | |
| 19 | 2006 | 24 | |
| 20 | 2013 | 24 |
About Joseph Bernstein
Joseph Bernstein is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Biomedical Engineering, Computational Mechanics and Software, having authored 142 papers that have together received 1.9k indexed citations. Recurring topics across this work include Semiconductor materials and devices (78 papers), Integrated Circuits and Semiconductor Failure Analysis (68 papers), Advancements in Semiconductor Devices and Circuit Design (55 papers), Silicon Carbide Semiconductor Technologies (16 papers), Advanced Surface Polishing Techniques (14 papers), Electronic Packaging and Soldering Technologies (14 papers), Electrostatic Discharge in Electronics (12 papers) and Laser Material Processing Techniques (9 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.6k citations), Hardware and Architecture (142 citations), Software (42 citations), Safety, Risk, Reliability and Quality (57 citations) and Statistics, Probability and Uncertainty (35 citations). Joseph Bernstein has collaborated with scholars based in United States, Israel and China. Frequent co-authors include Jin Qin, Xiaojun Li, John S. Suehle, Eric M. Vogel, Moshe Gurfinkel, Yoram Shapira, Neil Goldsman, Aivars J. Lelis, Bing Hua Huang and Dawei Heh. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Electron Devices, IEEE Electron Device Letters and IEEE Transactions on Semiconductor Manufacturing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.